Inventor · disambiguated record
Ryuji Ohba
Also filed as: OHBA RYUJI
22 granted patents·7 pending applications·219 citations·filing 1996–2018
95Inventor score
Top patents by PatentIndex Score
29 records- 0193US8587050B2Semiconductor memoryOHBA RYUJI·Filed 2012·Granted Nov 19, 2013·21 cites·10 claims
- 0291US8969843B2Memory deviceTOSHIBA KK·Filed 2013·Granted Mar 3, 2015·9 cites·21 claims
- 0391US6680505B2Semiconductor storage elementTOSHIBA KK·Filed 2002·Granted Jan 20, 2004·68 cites·22 claims
- 0478US5734181ASemiconductor device and manufacturing method thereforTOSHIBA KK·Filed 1996·Granted Mar 31, 1998·53 cites·17 claims
- 0577US8307022B2Random number generating deviceMATSUMOTO MARI·Filed 2008·Granted Nov 6, 2012·9 cites·19 claims
- 0677US8039890B2Random number generating deviceTOSHIBA KK·Filed 2007·Granted Oct 18, 2011·8 cites·13 claims
- 0776US10903228B2Semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Jan 26, 2021·2 cites·15 claims
- 0876US9721654B1Memory deviceTOSHIBA KK·Filed 2016·Granted Aug 1, 2017·4 cites·20 claims
- 0975US7629642B2Semiconductor deviceTOSHIBA KK·Filed 2005·Granted Dec 8, 2009·6 cites·22 claims
- 1070US10658480B2Memory deviceTOSHIBA MEMORY CORP·Filed 2018·Granted May 19, 2020·1 cites·10 claims
- 1169US7111029B2Random number generating circuitTOSHIBA KK·Filed 2002·Granted Sep 19, 2006·14 cites·19 claims
- 1267US8890231B2Nonvolatile semiconductor memory device with a narrowing charge storage layerOHBA RYUJI·Filed 2012·Granted Nov 18, 2014·2 cites·23 claims
- 1360US7573094B2Random number generating elementTOSHIBA KK·Filed 2004·Granted Aug 11, 2009·7 cites·30 claims
- 1458US9061898B2Memory deviceOHBA RYUJI·Filed 2012·Granted Jun 23, 2015·1 cites·14 claims
- 1558US8916923B2Nonvolatile semiconductor memoryOHBA RYUJI·Filed 2011·Granted Dec 23, 2014·1 cites·15 claims
- 1658US8742489B2Nonvolatile semiconductor memoryOHBA RYUJI·Filed 2012·Granted Jun 3, 2014·1 cites·9 claims
- 1757US8115248B2Semiconductor device and method for manufacturing the sameKAI TETSUYA·Filed 2009·Granted Feb 14, 2012·1 cites·10 claims
- 1854US6690030B2Semiconductor device with negative differential resistance characteristicsTOSHIBA KK·Filed 2001·Granted Feb 10, 2004·6 cites·20 claims
- 1953US6787795B2Logic apparatus and logic circuitTOSHIBA KK·Filed 2001·Granted Sep 7, 2004·5 cites·10 claims
- 2050US2015021678A1Nonvolatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2014·Application pending·0 cites
- 2149USRE44630ESemiconductor device and method for manufacturing the sameKAI TETSUYA·Filed 2012·Granted Dec 10, 2013·0 cites·20 claims
- 2244US9041091B2Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted May 26, 2015·0 cites·20 claims
- 2341US2015263121A1Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2014·Application pending·0 cites
- 2440US7138651B2Logic apparatus and logic circuitTOSHIBA KK·Filed 2004·Granted Nov 21, 2006·0 cites·3 claims
- 2539US2013015518A1Semiconductor memory deviceTOSHIBA KK·Filed 2012·Application pending·0 cites
- 2637US2017077111A1Nonvolatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2016·Application pending·0 cites
- 2735US2012018792A1Nonvolatile semiconductor memory device and method of manufacturing the sameMATSUSHITA DAISUKE·Filed 2010·Application pending·0 cites
- 2834US2016260815A1Non-volatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2015·Application pending·0 cites
- 2933US2016071853A1Semiconductor memory deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →