Inventor · disambiguated record
Ryuji Ohno
Also filed as: Ohno ryuji
3 granted patents·10 citations·filing 2011–2012
59Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0178US8411263B2Method of evaluating silicon wafer and method of manufacturing silicon waferUCHINO SHIN·Filed 2012·Granted Apr 2, 2013·8 cites·7 claims
- 0250US8481346B2Method of analyzing iron concentration of boron-doped P-type silicon wafer and method of manufacturing silicon waferOhno ryuji·Filed 2011·Granted Jul 9, 2013·2 cites·5 claims
- 0332US9372223B2Method of evaluating metal contamination in semiconductor sample and method of manufacturing semiconductor substrateMATSUMOTO KEI·Filed 2012·Granted Jun 21, 2016·0 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Ryuji Ohno files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →