Inventor · disambiguated record
Ryuei Ono
Also filed as: ONO RYUEI
0 granted patents·5 pending applications·0 citations·filing 2006–2007
Files withFUJITSU LTD5
Top patents by PatentIndex Score
5 records- 0152US2008186513A1Method of measuring gap depth of thin film magnetic head for horizontal magnetic recording, and method of measuring neck height of thin film magnetic head for vertical magnetic recordingFUJITSU LTD·Filed 2007·Application pending·0 cites
- 0249US2007285836A1Magnetic head and method of producing the sameFUJITSU LTD·Filed 2006·Application pending·0 cites
- 0347US2008100960A1Wafer and insulation characteristic monitoring methodFUJITSU LTD·Filed 2007·Application pending·0 cites
- 0437US2008038849A1Evaluation method of fine pattern, manufacturing method of device having the fine patternFUJITSU LTD·Filed 2006·Application pending·0 cites
- 0527US2007297096A1Magnetic headFUJITSU LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →