Inventor · disambiguated record
Ryouichi Takagi
Also filed as: TAKAGI RYOUICHI
5 granted patents·201 citations·filing 1990–1996
85Inventor score
Files withMITSUBISHI ELECTRIC CORP5
Top patents by PatentIndex Score
5 records- 0188US5055780AProbe plate used for testing a semiconductor device, and a test apparatus thereforMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Oct 8, 1991·72 cites·7 claims
- 0285US5042148AMethod of manufacturing a probing card for wafer testingMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Aug 27, 1991·47 cites·5 claims
- 0377US4983908AProbing card for wafer testing and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jan 8, 1991·34 cites·8 claims
- 0459US5894172ASemiconductor device with identification functionMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Apr 13, 1999·26 cites·2 claims
- 0554US6150727ASemiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Nov 21, 2000·22 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →