Inventor · disambiguated record
Ryozo Takasu
Also filed as: TAKASU RYOZO
14 granted patents·2 pending applications·24 citations·filing 2007–2019
87Inventor score
Top patents by PatentIndex Score
16 records- 0192US10564086B2Particle concentration measuring apparatus with humidity correctionFUJITSU LTD·Filed 2016·Granted Feb 18, 2020·7 cites·13 claims
- 0285US10444192B2Environment measuring device and environment measuring methodFUJITSU LTD·Filed 2015·Granted Oct 15, 2019·3 cites·6 claims
- 0381US9928709B2Fire detection device and method of detecting fireFUJITSU LTD·Filed 2016·Granted Mar 27, 2018·8 cites·15 claims
- 0478US10408662B2Water amount measurement device and water amount monitoring systemFUJITSU LTD·Filed 2017·Granted Sep 10, 2019·2 cites·17 claims
- 0574US8034295B2Ion analyzing apparatus and ion analyzing methodFUJITSU LTD·Filed 2010·Granted Oct 11, 2011·2 cites·4 claims
- 0673US9395334B2Atmospheric environment measuring apparatus, atmospheric environment measuring method and atmospheric environment measuring systemFUJITSU LTD·Filed 2013·Granted Jul 19, 2016·2 cites·9 claims
- 0759US11371925B2Measurement apparatus for measuring mass concentration of particles using correlation of number concentration, humidity and concentration and measurement method for measuring mass concentration of particles using correlation of number concentration, humidity and concentrationFUJITSU LTD·Filed 2019·Granted Jun 28, 2022·0 cites·14 claims
- 0854US11199487B2Information processing systemFUJITSU LTD·Filed 2019·Granted Dec 14, 2021·0 cites·4 claims
- 0953US10495595B2Gas sensor device, gas measurement method, and gas measurement deviceFUJITSU LTD·Filed 2016·Granted Dec 3, 2019·0 cites·15 claims
- 1049US10724936B2Measurement apparatus, environment measurement apparatus and measurement methodFUJITSU LTD·Filed 2019·Granted Jul 28, 2020·0 cites·17 claims
- 1149US8173069B2Ion analyzing apparatus and ion analyzing methodTAKASU RYOZO·Filed 2011·Granted May 8, 2012·0 cites·5 claims
- 1243US10527596B2Calculation device and calculation methodFUJITSU LTD·Filed 2016·Granted Jan 7, 2020·0 cites·14 claims
- 1341US9952131B2Measurement device and method of measuringFUJITSU LTD·Filed 2015·Granted Apr 24, 2018·0 cites·9 claims
- 1441US2017299536A1Gas analyzer and gas analysis methodFUJITSU LTD·Filed 2017·Application pending·0 cites
- 1539US8536873B2Substance detection method and substance detection deviceTAKASU RYOZO·Filed 2011·Granted Sep 17, 2013·0 cites·9 claims
- 1638US2007170364A1Alpha ray dose rate measuring methodFUJITSU LTD·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →