Inventor · disambiguated record
Ryohei Yabe
Also filed as: YABE RYOHEI
13 granted patents·961 citations·filing 1978–1996
95Inventor score
Top patents by PatentIndex Score
13 records- 0195US5690895AFlow cell apparatusHITACHI LTD·Filed 1996·Granted Nov 25, 1997·189 cites·51 claims
- 0294US4810869AAutomatic focusing control method for microscopeHITACHI LTD·Filed 1987·Granted Mar 7, 1989·109 cites·8 claims
- 0392US4812909ACell classification apparatus capable of displaying a scene obtained by superimposing a character scene and graphic scene on a CRTHITACHI LTD·Filed 1987·Granted Mar 14, 1989·90 cites·13 claims
- 0489US5449622AMethod and apparatus for analyzing stained particlesFiled 1994·Granted Sep 12, 1995·97 cites·13 claims
- 0589US4807984AApparatus and method for specimen inspectionHITACHI LTD·Filed 1987·Granted Feb 28, 1989·74 cites·7 claims
- 0687US5880835AApparatus for investigating particles in a fluid, and a method of operation thereofHITACHI LTD·Filed 1996·Granted Mar 9, 1999·85 cites·10 claims
- 0787US5270212ACell analysis apparatusHITACHI LTD·Filed 1992·Granted Dec 14, 1993·61 cites·14 claims
- 0886US4263512AColorimetric method for liquid sampler including disturbing chromogensHITACHI LTD·Filed 1978·Granted Apr 21, 1981·55 cites·12 claims
- 0985US4761075ACellular analysis systemHITACHI LTD·Filed 1986·Granted Aug 2, 1988·97 cites·6 claims
- 1074US5585469ADyeing agent having at least two dyes for staining a biological sample and staining method employing the dyeing agentHITACHI LTD·Filed 1994·Granted Dec 17, 1996·40 cites·23 claims
- 1160US5715182ADevice for the classification and examination of particles in fluidHITACHI LTD·Filed 1994·Granted Feb 3, 1998·38 cites·14 claims
- 1252US5561517AMethod and apparatus for flow type particle image analysis using a pulse light emitted at any of an odd and even image field reading-out periodHITACHI LTD·Filed 1994·Granted Oct 1, 1996·17 cites·31 claims
- 1341US4318615AAutomatic rate analyzing methodSAGUSA HISAYUKI·Filed 1979·Granted Mar 9, 1982·9 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →