Inventor · disambiguated record
S J. Chey
Also filed as: CHEY S J
1 granted patent·2 pending applications·0 citations·filing 2017–2019
14Inventor score
Technology areasH10P
Files withIBM3
Top patents by PatentIndex Score
3 records- 0153US11131689B2Low-force wafer test probesIBM·Filed 2017·Granted Sep 28, 2021·0 cites·9 claims
- 0252US2019227100A1Processes for fabricating low-force wafer test probes and their structuresIBM·Filed 2019·Application pending·0 cites
- 0349US2018340959A1Processes for fabricating low-force wafer test probes and their structuresIBM·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →