Inventor · disambiguated record
Sang-Bae An
Also filed as: AN SANG-BAE
3 granted patents·1 pending application·14 citations·filing 1997–2008
65Inventor score
Top patents by PatentIndex Score
4 records- 0164US7859287B2Device power supply extension circuit, test system including the same and method of testing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Dec 28, 2010·6 cites·19 claims
- 0242US7114108B2Semiconductor test system and method for effectively testing a semiconductor device having many pinsSAMSUNG EELCTRONICS CO LTD·Filed 2001·Granted Sep 26, 2006·4 cites·16 claims
- 0333US2006126248A1Method and apparatus for controlling device power supply in semiconductor testerSAMSUNG ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
- 0427US5852300ADevice for sensing a flat zone of a wafer for use in a wafer probe testerSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Dec 22, 1998·4 cites·14 claims
Join the waitlist — get patent alerts
Get an alert when Sang-Bae An files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →