Inventor · disambiguated record
Sanghyeon Baeg
Also filed as: BAEG SANGHYEON
7 granted patents·414 citations·filing 1993–2015
88Inventor score
Top patents by PatentIndex Score
7 records- 0195US5812562ALow cost emulation scheme implemented via clock control using JTAG controller in a scan environmentSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 22, 1998·207 cites·5 claims
- 0284US5805608AClock generation for testing of integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 8, 1998·67 cites·14 claims
- 0383US6018815AAdaptable scan chains for debugging and manufacturing test purposesSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jan 25, 2000·59 cites·23 claims
- 0483US5793776AStructure and method for SDRAM dynamic self refresh entry and exit using JTAGSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Aug 11, 1998·57 cites·16 claims
- 0552US9941192B2Semiconductor device having repairable penetration electrodeIUCF HYU ERICA CAMPUS·Filed 2015·Granted Apr 10, 2018·1 cites·15 claims
- 0647US5519713AIntegrated circuit having clock-line control and method for testing sameUNIV TEXAS·Filed 1993·Granted May 21, 1996·13 cites·33 claims
- 0737US5917832ASelf-test circuit and method utilizing interlaced scanning for testing a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jun 29, 1999·10 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →