Inventor · disambiguated record
Samuele Carrera
Also filed as: CARRERA SAMUELE
2 granted patents·17 citations·filing 1994–1995
54Inventor score
Technology areasG03F
Top patents by PatentIndex Score
2 records- 0160US5622796AProcess for producing metrological structures particularly for direct measurement of errors introduced by alignment systemsST MICROELECTRONICS SRL·Filed 1994·Granted Apr 22, 1997·17 cites·70 claims
- 0223US5985494AMetrological structures particularly for direct measurement of errors introduced by alignment systemsSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Nov 16, 1999·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →