Inventor · disambiguated record
Sang-Bong Choi
Also filed as: CHOI SANG-BONG
9 granted patents·224 citations·filing 1995–2008
89Inventor score
Top patents by PatentIndex Score
9 records- 0190US6440760B1Method of measuring etched state of semiconductor wafer using optical impedence measurementSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 27, 2002·67 cites·67 claims
- 0282US6528333B1Method of and device for detecting micro-scratchesSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Mar 4, 2003·28 cites·18 claims
- 0381US6366688B1Apparatus and method for contact failure inspection in semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Apr 2, 2002·53 cites·54 claims
- 0476US6449037B2Method of and device for detecting micro-scratchesSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Sep 10, 2002·19 cites·4 claims
- 0567US5692954AAir-shower system for a clean roomSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 2, 1997·43 cites·20 claims
- 0662US6515293B1Method and apparatus for detecting thickness of thin layer formed on a waferSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Feb 4, 2003·9 cites·2 claims
- 0751US7027638B2Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Apr 11, 2006·4 cites·18 claims
- 0846US6870948B2Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM imageSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Mar 22, 2005·1 cites·31 claims
- 0936US8153862B2Cytochrome P450 gene for increasing seed size or water stress resistance of plantKIM HO BANG·Filed 2008·Granted Apr 10, 2012·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →