Inventor · disambiguated record
Saishi Fujikawa
Also filed as: FUJIKAWA SAISHI
38 granted patents·4 pending applications·654 citations·filing 2001–2020
98Inventor score
Files withSEMICONDUCTOR ENERGY LAB25HOSOYA KUNIO7FUJIKAWA SAISHI6YAMAZAKI SHUNPEI3SHARP KABUSHIKI KAISHA CO LTD1
Top patents by PatentIndex Score
42 records- 0198US6953951B2Semiconductor device, and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2001·Granted Oct 11, 2005·126 cites·48 claims
- 0297US7459352B2Semiconductor device, and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Dec 2, 2008·28 cites·26 claims
- 0397US7375376B2Semiconductor display device and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted May 20, 2008·48 cites·22 claims
- 0497US7148510B2Electronic apparatus having a protective circuitSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Dec 12, 2006·52 cites·24 claims
- 0596US6911688B2Semiconductor display device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2003·Granted Jun 28, 2005·92 cites·24 claims
- 0695US8400590B2Liquid crystal display deviceFUJIKAWA SAISHI·Filed 2012·Granted Mar 19, 2013·15 cites·33 claims
- 0795US7964874B2Semiconductor device having a protective circuitSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Jun 21, 2011·25 cites·4 claims
- 0895US7786482B2Diode and display device including diodeSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Aug 31, 2010·39 cites·13 claims
- 0994US8344379B2Display device and manufacturing method of the sameSEMICONDUCTOR ENERGY LAB·Filed 2009·Granted Jan 1, 2013·18 cites·24 claims
- 1093US8164718B2Liquid crystal display deviceFUJIKAWA SAISHI·Filed 2007·Granted Apr 24, 2012·15 cites·45 claims
- 1193US8115210B2Semiconductor display deviceYAMAZAKI SHUNPEI·Filed 2011·Granted Feb 14, 2012·11 cites·20 claims
- 1293US7615495B2Display device and manufacturing method of the sameSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted Nov 10, 2009·18 cites·48 claims
- 1392US8643021B2Semiconductor device including multiple insulating filmsYAMAZAKI SHUNPEI·Filed 2012·Granted Feb 4, 2014·11 cites·20 claims
- 1492US8421135B2Semiconductor device, and manufacturing method thereofYAMAZAKI SHUNPEI·Filed 2008·Granted Apr 16, 2013·9 cites·31 claims
- 1592US8273614B2Semiconductor device and method of manufacturing the sameHOSOYA KUNIO·Filed 2010·Granted Sep 25, 2012·13 cites·16 claims
- 1692US7824939B2Method for manufacturing display device comprising separated and electrically connected source wiring layersSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Nov 2, 2010·25 cites·10 claims
- 1790US10665610B2Semiconductor device, and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted May 26, 2020·2 cites·5 claims
- 1890US8268654B2Method for manufacturing LCD with reduced mask countFUJIKAWA SAISHI·Filed 2008·Granted Sep 18, 2012·17 cites·29 claims
- 1990US7842528B2Method for manufacturing an LCD device employing a reduced number of photomasksSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Nov 30, 2010·15 cites·5 claims
- 2088US7777224B2Semiconductor device and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Aug 17, 2010·13 cites·8 claims
- 2186US7537979B2Method of manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted May 26, 2009·9 cites·30 claims
- 2285US9059216B2Semiconductor device, and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Jun 16, 2015·2 cites·9 claims
- 2382US8541785B2Display deviceHOSOYA KUNIO·Filed 2009·Granted Sep 24, 2013·9 cites·12 claims
- 2482US8048697B2Method for manufacturing an LCD device employing a reduced number of photomasks including bottom and top gate type devicesSEMICONDUCTOR ENERGY LAB·Filed 2010·Granted Nov 1, 2011·5 cites·6 claims
- 2579US7115488B2Method of manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2004·Granted Oct 3, 2006·18 cites·40 claims
- 2678US8148730B2Semiconductor device and method for manufacturing semiconductor deviceHOSOYA KUNIO·Filed 2008·Granted Apr 3, 2012·6 cites·12 claims
- 2778US7776664B2Method of manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Aug 17, 2010·7 cites·18 claims
- 2873US8895333B2Method for manufacturing semiconductor device with pixel electrode over gate electrode of thin film transistorFUJIKAWA SAISHI·Filed 2012·Granted Nov 25, 2014·3 cites·31 claims
- 2973US8144301B2Semiconductor deviceFUJIKAWA SAISHI·Filed 2007·Granted Mar 27, 2012·3 cites·23 claims
- 3073US2020286925A1Semiconductor device, and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2020·Application pending·0 cites
- 3165US9666601B2Semiconductor device, and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted May 30, 2017·0 cites·6 claims
- 3257US8395745B2Semiconductor deviceFUJIKAWA SAISHI·Filed 2012·Granted Mar 12, 2013·0 cites·9 claims
- 3353US9564517B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Feb 7, 2017·0 cites·16 claims
- 3453US8278713B2Display device and manufacturing method thereofHOSOYA KUNIO·Filed 2009·Granted Oct 2, 2012·0 cites·17 claims
- 3552US8441021B2Display device and manufacturing method thereofHOSOYA KUNIO·Filed 2012·Granted May 14, 2013·0 cites·20 claims
- 3650US2009148970A1Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2008·Application pending·0 cites
- 3749US8404525B2Semiconductor device, manufacturing method of semiconductor device, and RFID tagHOSOYA KUNIO·Filed 2011·Granted Mar 26, 2013·0 cites·14 claims
- 3847US9006050B2Semiconductor device and method for manufacturing semiconductor deviceHOSOYA KUNIO·Filed 2012·Granted Apr 14, 2015·0 cites·18 claims
- 3947US7714367B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2007·Granted May 11, 2010·0 cites·20 claims
- 4047US2007158804A1Semiconductor device, manufacturing method of semiconductor device, and RFID tagSEMICONDUCTOR ENERGY LAB·Filed 2007·Application pending·0 cites
- 4143US2007002199A1Liquid crystal display device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2006·Application pending·0 cites
- 4232US7202149B2Semiconductor device and manufacturing method thereofSHARP KABUSHIKI KAISHA CO LTD·Filed 2004·Granted Apr 10, 2007·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →