Inventor · disambiguated record
Santiago Serrano Guisan
Also filed as: GUISAN SANTIAGO SERRANO
11 granted patents·10 citations·filing 2017–2022
83Inventor score
Top patents by PatentIndex Score
11 records- 0192US10950782B2Nitride diffusion barrier structure for spintronic applicationsHEADWAY TECH INC·Filed 2019·Granted Mar 16, 2021·4 cites·17 claims
- 0288US11264560B2Minimal thickness, low switching voltage magnetic free layers using an oxidation control layer and magnetic moment tuning layer for spintronic applicationsHEADWAY TECH INC·Filed 2019·Granted Mar 1, 2022·3 cites·17 claims
- 0377US11264566B2Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratioHEADWAY TECH INC·Filed 2019·Granted Mar 1, 2022·1 cites·14 claims
- 0476US10788561B2Method for measuring saturation magnetization of magnetic films and multilayer stacksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 29, 2020·1 cites·20 claims
- 0576US10754000B2Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level characterization of magnetic filmsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Aug 25, 2020·1 cites·68 claims
- 0669US11609296B2Method for measuring saturation magnetization of magnetic films and multilayer stacksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 21, 2023·0 cites·20 claims
- 0769US11237240B2Multi-probe ferromagnetic resonance (FMR) apparatus for wafer level characterization of magnetic filmsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 1, 2022·0 cites·20 claims
- 0867US11683994B2Magnetic element with perpendicular magnetic anisotropy (PMA) and improved coercivity field (Hc)/switching current ratioHEADWAY TECH INC·Filed 2022·Granted Jun 20, 2023·0 cites·17 claims
- 0967US11397226B2Ferromagnetic resonance (FMR) electrical testing apparatus for spintronic devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 26, 2022·0 cites·20 claims
- 1060US11092661B2Scanning ferromagnetic resonance (FMR) for wafer-level characterization of magnetic films and multilayersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 17, 2021·0 cites·20 claims
- 1157US10401464B2Scanning ferromagnetic resonance (FMR) for wafer-level characterization of magnetic films and multilayersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Sep 3, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →