Inventor · disambiguated record
Satoshi Kuboyama
Also filed as: KUBOYAMA SATOSHI
7 granted patents·95 citations·filing 2003–2018
84Inventor score
Top patents by PatentIndex Score
7 records- 0186US7504850B2Single-event-effect tolerant SOI-based inverter, NAND element, NOR element, semiconductor memory device and data latch circuitJAPAN AEROSPACE EXPLORATION·Filed 2006·Granted Mar 17, 2009·27 cites·14 claims
- 0279US7332780B2Inverter, semiconductor logic circuit, static random access memory and data latch circuitJAPAN AEROSPACE EXPLORATION·Filed 2003·Granted Feb 19, 2008·41 cites·23 claims
- 0374US9842912B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Dec 12, 2017·2 cites·15 claims
- 0474US7576583B2Single-event effect tolerant latch circuit and flip-flop circuitJAPAN AEROSPACE EXPLORATION·Filed 2006·Granted Aug 18, 2009·12 cites·34 claims
- 0559US6885063B2Semiconductor device having an SEB voltage suitable for use in spaceNAT SPACE DEV AGENCY·Filed 2003·Granted Apr 26, 2005·12 cites·3 claims
- 0652US11115008B2Single event upset-tolerant latch circuit and flip-flop circuitJAPAN AEROSPACE EXPLORATION·Filed 2018·Granted Sep 7, 2021·1 cites·12 claims
- 0748US10164058B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Dec 25, 2018·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →