Inventor · disambiguated record
Sang-Jin Kyung
Also filed as: KYUNG SANG-JIN
0 granted patents·2 pending applications·0 citations·filing 2008–2011
Technology areasH10P
Top patents by PatentIndex Score
2 records- 0127US2008186046A1Test socket for testing semiconductor chip, test apparatus including the test socket and method for testing semiconductor chipSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0213US2012169366A1Socket contact for testing a semiconductorIY HYUN-GUEN·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Sang-Jin Kyung files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →