Inventor · disambiguated record
Sang Yee Loong
Also filed as: LOONG SANG YEE
30 granted patents·1 pending application·1,030 citations·filing 1999–2009
98Inventor score
Top patents by PatentIndex Score
31 records- 0198US6492726B1Chip scale packaging with multi-layer flip chip arrangement and ball grid array interconnectionCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Dec 10, 2002·267 cites·28 claims
- 0293US6261917B1High-K MOM capacitorCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jul 17, 2001·78 cites·30 claims
- 0391US6406994B1Triple-layered low dielectric constant dielectric dual damascene approachCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jun 18, 2002·31 cites·20 claims
- 0490US6252290B1Method to form, and structure of, a dual damascene interconnect deviceCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Jun 26, 2001·123 cites·19 claims
- 0589US6611024B2Method of forming PID protection diode for SOI waferCHARTERED SEMICONDUCTOR MFG·Filed 2001·Granted Aug 26, 2003·44 cites·8 claims
- 0687US6303414B1Method of forming PID protection diode for SOI waferCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Oct 16, 2001·42 cites·11 claims
- 0787US6110787AMethod for fabricating a MOS deviceCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Aug 29, 2000·99 cites·24 claims
- 0884US6406948B1Method for forming an ESD protection network for SOI technology with the ESD device formed in an underlying silicon substrateCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jun 18, 2002·33 cites·18 claims
- 0980US6376379B1Method of hard mask patterningCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Apr 23, 2002·25 cites·26 claims
- 1076US6787422B2Method of body contact for SOI mosfetCHARTERED SEMICONDUCTOR MFG·Filed 2001·Granted Sep 7, 2004·20 cites·9 claims
- 1175US6416909B1Alternating phase shift mask and method for fabricating the alignment monitorCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jul 9, 2002·16 cites·25 claims
- 1273US7045455B2Via electromigration improvement by changing the via bottom geometric profileCHARTERED SEMICONDUCTOR MFG·Filed 2003·Granted May 16, 2006·17 cites·14 claims
- 1373US6582856B1Simplified method of fabricating a rim phase shift maskCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jun 24, 2003·13 cites·19 claims
- 1469US6963113B2Method of body contact for SOI MOSFETCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Nov 8, 2005·13 cites·14 claims
- 1568US6530380B1Method for selective oxide etching in pre-metal depositionCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Mar 11, 2003·40 cites·13 claims
- 1667US6465296B1Vertical source/drain contact semiconductorCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Oct 15, 2002·14 cites·16 claims
- 1766US6653674B2Vertical source/drain contact semiconductorCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Nov 25, 2003·11 cites·24 claims
- 1863US6492242B1Method of forming of high K metallic dielectric layerCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Dec 10, 2002·8 cites·14 claims
- 1963US6248618B1Method of fabrication of dual gate oxides for CMOS devicesCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Jun 19, 2001·22 cites·22 claims
- 2062US6486515B2ESD protection network used for SOI technologyCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Nov 26, 2002·9 cites·6 claims
- 2160US6764914B2Method of forming a high K metallic dielectric layerCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Jul 20, 2004·6 cites·8 claims
- 2260US6214680B1Method to fabricate a sub-quarter-micron MOSFET with lightly doped source/drain regionsCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Apr 10, 2001·22 cites·29 claims
- 2359US7781895B2Via electromigration improvement by changing the via bottom geometric profileCHARTERED SEMICONDUCTOR MFG·Filed 2009·Granted Aug 24, 2010·1 cites·12 claims
- 2458US6284609B1Method to fabricate a MOSFET using selective epitaxial growth to form lightly doped source/drain regionsCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Sep 4, 2001·22 cites·27 claims
- 2556US6300172B1Method of field isolation in silicon-on-insulator technologyCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Oct 9, 2001·22 cites·27 claims
- 2653US6258677B1Method of fabricating wedge isolation transistorsCHARTERED SEMINCONDUCTOR MFG L·Filed 1999·Granted Jul 10, 2001·22 cites·19 claims
- 2748US7691739B2Via electromigration improvement by changing the via bottom geometric profileCHARTERED SEMICONDUCTOR MFG·Filed 2006·Granted Apr 6, 2010·0 cites·12 claims
- 2847US6399431B1ESD protection device for SOI technologyCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Jun 4, 2002·3 cites·18 claims
- 2938US6737739B2Method of vacuum packaging a semiconductor device assemblyCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted May 18, 2004·0 cites·16 claims
- 3037US6495399B1Method of vacuum packaging a semiconductor device assemblyCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Dec 17, 2002·7 cites·19 claims
- 3137US2002048884A1Vertical source/drain contact semiconductorFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →