Inventor · disambiguated record
Sandeep Mehta
Also filed as: MEHTA SANDEEP
19 granted patents·9 pending applications·560 citations·filing 1990–2024
93Inventor score
Files withVARIAN SEMICONDUCTOR EQUIPMENT8INSPIRD INC4MEHTA SANDEEP3IBM2NOKIA SOLUTIONS & NETWORKS OY2
Top patents by PatentIndex Score
28 records- 0198US9099423B2Doped semiconductor films and processingASM IP HOLDING BV·Filed 2013·Granted Aug 4, 2015·414 cites·28 claims
- 0293US7544957B2Non-uniform ion implantationVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2006·Granted Jun 9, 2009·19 cites·12 claims
- 0387US7326937B2Plasma ion implantation systems and methods using solid source of dopant materialVERIAN SEMICONDUCTOR EQUIPMENT·Filed 2005·Granted Feb 5, 2008·17 cites·26 claims
- 0482US6756600B2Ion implantation with improved ion source life expectancyADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 29, 2004·42 cites·22 claims
- 0579US8620702B2Method and system for research and development management in an enterpriseMEHTA SANDEEP·Filed 2008·Granted Dec 31, 2013·8 cites·25 claims
- 0678US7993698B2Techniques for temperature controlled ion implantationVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2006·Granted Aug 9, 2011·5 cites·8 claims
- 0774US5220497AMethod and apparatus for controlling high speed vehiclesPHILIPS CORP·Filed 1990·Granted Jun 15, 1993·38 cites·18 claims
- 0872US9054652B2Using fractional delay computations to improve intermodulation performanceNOKIA SOLUTIONS & NETWORKS OY·Filed 2013·Granted Jun 9, 2015·4 cites·21 claims
- 0962US7464400B2Distributed environment controlled access facilityIBM·Filed 2003·Granted Dec 9, 2008·10 cites·12 claims
- 1062US7459703B2Ion implant beam angle integrity monitoring and adjustingVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2005·Granted Dec 2, 2008·1 cites·24 claims
- 1161US10586194B2Method and system for managing research and development in an enterpriseINSPIRD INC·Filed 2013·Granted Mar 10, 2020·0 cites·8 claims
- 1259US11580477B2Method and system for managing research and development in an enterpriseINSPIRD INC·Filed 2020·Granted Feb 14, 2023·0 cites·20 claims
- 1356US7378335B2Plasma implantation of deuterium for passivation of semiconductor-device interfacesVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2005·Granted May 27, 2008·1 cites·19 claims
- 1456US2015006954A1System and method for responding to failure of a hardware locus at a communication installationROCKSTAR CONSORTIUM US LP·Filed 2014·Application pending·0 cites
- 1554US7886342B2Distributed environment controlled access facilityIBM·Filed 2008·Granted Feb 8, 2011·1 cites·15 claims
- 1654US7544959B2In situ surface contamination removal for ion implantingVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2008·Granted Jun 9, 2009·0 cites·10 claims
- 1754US2025297965A1Calibration of the tilt angle of an incident beam of an examination systemAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1851US11514093B2Method and system for technical language processingINSPIRD INC·Filed 2020·Granted Nov 29, 2022·0 cites·20 claims
- 1950US8954795B2System and method for responding to failure of a hardware locus at a communication installationMEHTA SANDEEP·Filed 2011·Granted Feb 10, 2015·0 cites·19 claims
- 2049US2022068152A1System, apparatus, method for assessment of an athlete's performance in an athletic sportJOHNSON CLARENCE R·Filed 2021·Application pending·0 cites
- 2148US8074111B1System and method for responding to failure of a hardware locus at a communication installationMEHTA SANDEEP·Filed 2006·Granted Dec 6, 2011·0 cites·18 claims
- 2246US2021357858A1Method and system for managing product certificationINSPIRD INC·Filed 2020·Application pending·0 cites
- 2344US9755583B2Using fractional delay computations to improve intermodulation performanceNOKIA SOLUTIONS & NETWORKS OY·Filed 2014·Granted Sep 5, 2017·0 cites·19 claims
- 2444US2007069157A1Methods and apparatus for plasma implantation with improved dopant profileVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2005·Application pending·0 cites
- 2540US2006099830A1Plasma implantation using halogenated dopant species to limit deposition of surface layersVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2004·Application pending·0 cites
- 2639US2006205192A1Shallow-junction fabrication in semiconductor devices via plasma implantation and depositionVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2005·Application pending·0 cites
- 2738US2007048984A1Metal work function adjustment by ion implantationWALTHER STEVEN·Filed 2005·Application pending·0 cites
- 2836US2006040499A1In situ surface contaminant removal for ion implantingWALTHER STEVE·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →