Inventor · disambiguated record
Sachihiro Nakagawa
Also filed as: NAKAGAWA SACHIHIRO
3 granted patents·3 citations·filing 2017–2021
51Inventor score
Files withSYSTEM SQUARE INC3
Top patents by PatentIndex Score
3 records- 0182US10859516B2X-ray inspection apparatusSYSTEM SQUARE INC·Filed 2017·Granted Dec 8, 2020·3 cites·5 claims
- 0242US12430739B2Training data generation device, inspection device and programSYSTEM SQUARE INC·Filed 2021·Granted Sep 30, 2025·0 cites·5 claims
- 0335US12361094B2Training data generation device and training data generation programSYSTEM SQUARE INC·Filed 2019·Granted Jul 15, 2025·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →