Inventor · disambiguated record
Sakae Nakajima
Also filed as: NAKAJIMA SAKAE
10 granted patents·1 pending application·19 citations·filing 2004–2017
83Inventor score
Files withRENESAS ELECTRONICS CORP5NAKAHARA AKIHIRO2NEC ELECTRONICS CORP2NAKAJIMA SAKAE1SANDEN CORP1
Top patents by PatentIndex Score
11 records- 0187US8547142B2Power semiconductor device and operation method thereofNAKAHARA AKIHIRO·Filed 2011·Granted Oct 1, 2013·9 cites·20 claims
- 0268US7660091B2Overcurrent detecting circuit and semiconductor deviceNEC ELECTRONICS CORP·Filed 2008·Granted Feb 9, 2010·5 cites·7 claims
- 0366US8884682B2Power semiconductor deviceNAKAHARA AKIHIRO·Filed 2012·Granted Nov 11, 2014·2 cites·6 claims
- 0461US10425074B2Semiconductor apparatusRENESAS ELECTRONICS CORP·Filed 2017·Granted Sep 24, 2019·1 cites·6 claims
- 0554US9153688B2Detecting and driving load using MOS transistorRENESAS ELECTRONICS CORP·Filed 2014·Granted Oct 6, 2015·0 cites·27 claims
- 0650US9515650B2Detecting and driving load using transistorRENESAS ELECTRONICS CORP·Filed 2016·Granted Dec 6, 2016·0 cites·14 claims
- 0749US9503073B2Power semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2014·Granted Nov 22, 2016·0 cites·9 claims
- 0849US9300279B2Detecting and driving load using MOS transistorRENESAS ELECTRONICS CORP·Filed 2015·Granted Mar 29, 2016·0 cites·5 claims
- 0945US8508901B2Overcurrent detection circuitNAKAJIMA SAKAE·Filed 2009·Granted Aug 13, 2013·2 cites·18 claims
- 1041US7675089B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2007·Granted Mar 9, 2010·0 cites·19 claims
- 1141US2005097910A1Open showcaseSANDEN CORP·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →