Inventor · disambiguated record
Satoshi Ohtake
Also filed as: OHTAKE SATOSHI
4 granted patents·1 pending application·37 citations·filing 1998–2018
74Inventor score
Files withSEMICONDUCTOR TECH ACAD RES CT2CANON KK1FUJITSU LTD1NATIONAL UNIV CORPORATION NARA INSTITUTE OF SCIENCE AND TECHNOLOGY1
Top patents by PatentIndex Score
5 records- 0168US6735730B1Integrated circuit with design for testability and method for designing the sameSEMICONDUCTOR TECH ACAD RES CT·Filed 2000·Granted May 11, 2004·16 cites·10 claims
- 0257US9991006B2Asynchronous memory element for scanningNATIONAL UNIV CORPORATION NARA INSTITUTE OF SCIENCE AND TECHNOLOGY·Filed 2012·Granted Jun 5, 2018·1 cites·13 claims
- 0349US6633291B1Method and apparatus for displaying an imageFUJITSU LTD·Filed 2000·Granted Oct 14, 2003·6 cites·11 claims
- 0446US2019099796A1Manufacturing method of base member of rotatable fixing member and manufacturing method of the rotatable fixing memberCANON KK·Filed 2018·Application pending·0 cites
- 0545US6334200B1Testable integrated circuit, integrated circuit design-for-testability method, and computer-readable medium storing a program for implementing the design-for-testability methodSEMICONDUCTOR TECH ACAD RES CT·Filed 1998·Granted Dec 25, 2001·14 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →