Inventor · disambiguated record
Sangkil Park
Also filed as: PARK SANGKIL
2 granted patents·2 citations·filing 2018–2021
37Inventor score
Technology areasG06F
Top patents by PatentIndex Score
2 records- 0178US11899959B2Method of testing memory device, memory built-in self test (MBIST) circuit, and memory device for reducing test timeSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 13, 2024·1 cites·20 claims
- 0249US11462373B2Switch apparatus for automobileMOBASE ELECTRONICS CO LTD·Filed 2018·Granted Oct 4, 2022·1 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →