Inventor · disambiguated record
Sang Wuk Park
Also filed as: PARK SANG WUK
4 granted patents·7 pending applications·8 citations·filing 2010–2024
63Inventor score
Top patents by PatentIndex Score
11 records- 0187US9349747B2Semiconductor devices having gate stack portions that extend in a zigzag patternKIM HYUK·Filed 2015·Granted May 24, 2016·7 cites·20 claims
- 0266US2025254858A1Semiconductor memory device including lower electrode with bowing areaSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0365US2025176170A1Semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0464US2025234528A1Semiconductor memory device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0558US8872059B2Etching system and method of controlling etching process conditionPARK SANG-WUK·Filed 2011·Granted Oct 28, 2014·1 cites·20 claims
- 0655US2024164084A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0754US2025046629A1Ion beam etching apparatus, method for manufacturing semiconductor device using the same, and method for treating substrate using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0854US2025169057A1Semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0943US2016233233A1Semiconductor devices having gate stack portions that extend in a zigzag patternKIM HYUK·Filed 2016·Application pending·0 cites
- 1034US10192881B2Semiconductor devicePARK SANG WUK·Filed 2015·Granted Jan 29, 2019·0 cites·16 claims
- 1134US8304264B2Apparatus and method for monitoring chamber status in semiconductor fabrication processPARK SANG-WUK·Filed 2010·Granted Nov 6, 2012·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →