Inventor · disambiguated record
San-Ha Park
Also filed as: PARK SAN · PARK SAN-HA
21 granted patents·3 pending applications·198 citations·filing 1998–2025
94Inventor score
Files withWINBOND ELECTRONICS CORP8HYNIX SEMICONDUCTOR INC7HYUNDAI ELECTRONICS IND5SAMSUNG DISPLAY CO LTD2LG SEMICON CO LTD1
Top patents by PatentIndex Score
24 records- 0185US10740188B2Volatile memory device and method for efficient bulk data movement, backup operation in the volatile memory deviceWINBOND ELECTRONICS CORP·Filed 2018·Granted Aug 11, 2020·4 cites·13 claims
- 0282US10998081B1Memory storage device having automatic error repair mechanism and method thereofWINBOND ELECTRONICS CORP·Filed 2020·Granted May 4, 2021·2 cites·20 claims
- 0380US9978435B1Memory device and operation methods thereofWINBOND ELECTRONICS CORP·Filed 2017·Granted May 22, 2018·5 cites·28 claims
- 0478US11081149B1Memory device for artificial intelligence operationWINBOND ELECTRONICS CORP·Filed 2020·Granted Aug 3, 2021·1 cites·9 claims
- 0578US6667921B2Bitline precharge circuit and method in semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Dec 23, 2003·27 cites·10 claims
- 0673US6097653ACircuit and method for selectively overdriving a sense amplifierLG SEMICON CO LTD·Filed 1998·Granted Aug 1, 2000·33 cites·12 claims
- 0771US12439771B2Display device and method of providing the sameSAMSUNG DISPLAY CO LTD·Filed 2022·Granted Oct 7, 2025·0 cites·14 claims
- 0871US6194919B1Main amplifierHYUNDAI ELECTRONICS IND·Filed 1998·Granted Feb 27, 2001·30 cites·13 claims
- 0970US6343037B1Column redundancy circuit for semiconductor memoryHYUNDAI ELECTRONICS IND·Filed 2000·Granted Jan 29, 2002·18 cites·20 claims
- 1061US6337816B1Column redundancy circuit for semiconductor memoryHYNIX SEMICONDUCTOR INC·Filed 2000·Granted Jan 8, 2002·12 cites·16 claims
- 1160US6735134B2Semiconductor memory device and method for driving a sense amplifierHYNIX SEMICONDUCTOR INC·Filed 2002·Granted May 11, 2004·11 cites·12 claims
- 1260US6339343B1Data I/O buffer control circuitHYUNDAI ELECTRONICS IND·Filed 1999·Granted Jan 15, 2002·17 cites·12 claims
- 1359US6771550B2Semiconductor memory device with stable precharge voltage level of data linesHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Aug 3, 2004·10 cites·12 claims
- 1457US6172921B1Column redundancy circuit for semiconductor memoryHYUNDAI ELECTRONICS IND·Filed 1999·Granted Jan 9, 2001·17 cites·22 claims
- 1552US2025357428A1Semiconductor stacked waferWINBOND ELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 1651US11289385B2Semiconductor die and a method for detecting an edge crack in a semiconductor dieWINBOND ELECTRONICS CORP·Filed 2020·Granted Mar 29, 2022·0 cites·14 claims
- 1751US11010234B2Memory device and error detection method thereofWINBOND ELECTRONICS CORP·Filed 2019·Granted May 18, 2021·0 cites·14 claims
- 1850US11347342B2Conductive bonding structure for substrates and display device including the sameSAMSUNG DISPLAY CO LTD·Filed 2021·Granted May 31, 2022·0 cites·20 claims
- 1944US11100966B2Array edge repeater in memory deviceWINBOND ELECTRONICS CORP·Filed 2020·Granted Aug 24, 2021·0 cites·18 claims
- 2044US6574151B2Semiconductor memory device and write driving thereofHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Jun 3, 2003·4 cites·18 claims
- 2142US6947340B2Memory device for reducing skew of data and addressHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Sep 20, 2005·3 cites·8 claims
- 2242US2007205819A1Delay circuit with constant delay time regardless of process condition or voltage variation and pulse generator using the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 2336US2005093610A1Delay circuit with constant delay time regardless of process condition or voltage variation and pulse generator using the sameFiled 2004·Application pending·0 cites
- 2435US6366611B1Circuit for controlling equalization pulse widthHYUNDAI ELECTRONICS IND·Filed 1998·Granted Apr 2, 2002·4 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →