Inventor · disambiguated record
Satoshi Sekino
Also filed as: SEKINO SATOSHI
10 granted patents·4 pending applications·58 citations·filing 2002–2014
88Inventor score
Top patents by PatentIndex Score
14 records- 0177US8228462B2Optical element laminate, backlight, and liquid crystal display apparatusSASAKI JUN·Filed 2009·Granted Jul 24, 2012·8 cites·8 claims
- 0276US8692962B2Diffusion sheet and method of manufacturing the same, backlight, and liquid crystal display deviceSHIBATA AKIHIRO·Filed 2010·Granted Apr 8, 2014·3 cites·15 claims
- 0375US8844061B2Scanning probe microscopeBABA SHUICHI·Filed 2012·Granted Sep 23, 2014·3 cites·9 claims
- 0473US8342008B2Scanning probe microscopeHITACHI LTD·Filed 2008·Granted Jan 1, 2013·3 cites·7 claims
- 0572US8018557B2Retardation compensating plate to compensate residual retardation of a liquid crystal panel, a compensator, a liquid crystal display device, and a projection image display apparatus having the sameSONY CORP·Filed 2006·Granted Sep 13, 2011·5 cites·30 claims
- 0667US6936520B2Method for fabricating semiconductor device having gate electrode together with resistance elementFUJITSU LTD·Filed 2003·Granted Aug 30, 2005·14 cites·19 claims
- 0765US6639280B2Semiconductor device and semiconductor chip using SOI substrateFUJITSU LTD·Filed 2002·Granted Oct 28, 2003·12 cites·9 claims
- 0854US2014298548A1Scanning probe microscopeHITACHI LTD·Filed 2014·Application pending·0 cites
- 0953US6999278B2Cleaning tape with surface protrusions formed by particles of predetermined size/density and non-magnetic metal evaporated film of predetermined thicknessSONY CORP·Filed 2003·Granted Feb 14, 2006·2 cites·15 claims
- 1053US6800374B2Cleaning tapeSONY CORP·Filed 2002·Granted Oct 5, 2004·5 cites·28 claims
- 1147US6991996B2Manufacturing method of semiconductor device and semiconductor chip using SOI substrate, facilitating cleavingFUJITSU LTD·Filed 2003·Granted Jan 31, 2006·3 cites·5 claims
- 1244US2008087820A1Probe control method for scanning probe microscopeKURENUMA TORU·Filed 2007·Application pending·0 cites
- 1341US2007051887A1Cantilever and inspecting apparatusHIDAKA KISHIO·Filed 2006·Application pending·0 cites
- 1441US2010043108A1Probe for scanning probe microscopeHITACHI CONSTRUCTION MACHINERY·Filed 2008·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Satoshi Sekino files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →