Inventor · disambiguated record
Saar Shabtay
Also filed as: SHABTAY SAAR
9 granted patents·26 citations·filing 2014–2022
81Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD9
Top patents by PatentIndex Score
9 records- 0193US9286675B1Iterative defect filtering processAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Mar 15, 2016·23 cites·20 claims
- 0287US10871451B2System, method and computer program product for object examinationAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Dec 22, 2020·2 cites·17 claims
- 0379US10408764B2System, method and computer program product for object examinationAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Sep 10, 2019·1 cites·19 claims
- 0468US11592400B2System, method and computer program product for object examinationAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Feb 28, 2023·0 cites·20 claims
- 0564US11940390B2Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interestAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Mar 26, 2024·0 cites·20 claims
- 0655US11360030B2Selecting a coreset of potential defects for estimating expected defects of interestAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jun 14, 2022·0 cites·16 claims
- 0752US10049441B2Iterative defect filtering processAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Aug 14, 2018·0 cites·19 claims
- 0848US10818000B2Iterative defect filtering processAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Oct 27, 2020·0 cites·20 claims
- 0948US10605745B2Guided inspection of a semiconductor wafer based on systematic defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 31, 2020·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →