Inventor · disambiguated record
Satoshi Takenaka
Also filed as: TAKENAKA SATOSHI
25 granted patents·8 pending applications·795 citations·filing 1979–2025
96Inventor score
Top patents by PatentIndex Score
33 records- 0194US6180957B1Thin-film semiconductor device, and display system using the sameSEIKO EPSON CORP·Filed 1997·Granted Jan 30, 2001·135 cites·14 claims
- 0294US5563427AActive matrix panel and manufacturing method including TFTs having variable impurity concentration levelsSEIKO EPSON CORP·Filed 1994·Granted Oct 8, 1996·196 cites·27 claims
- 0388US6235563B1Semiconductor device and method of manufacturing the sameSEIKO EPSON CORP·Filed 1991·Granted May 22, 2001·95 cites·41 claims
- 0486US6765637B2Translucent reflection type electro-optic devices and methods for manufacturing the sameSEIKO EPSON CORP·Filed 2002·Granted Jul 20, 2004·32 cites·15 claims
- 0584US6808965B1Methodology for fabricating a thin film transistor, including an LDD region, from amorphous semiconductor film deposited at 530° C. or less using low pressure chemical vapor depositionSEIKO EPSON CORP·Filed 1994·Granted Oct 26, 2004·76 cites·24 claims
- 0683US6614053B1Active matrix substrate, electrooptical device, and method of producing active matrix substrateSEIKO EPSON CORP·Filed 2000·Granted Sep 2, 2003·28 cites·15 claims
- 0783US5953582AActive matrix panel manufacturing method including TFTS having variable impurity concentration levelsSEIKO EPSON CORP·Filed 1997·Granted Sep 14, 1999·59 cites·6 claims
- 0882US9097684B2Specimen inspection apparatusSEIKO EPSON CORP·Filed 2014·Granted Aug 4, 2015·4 cites·7 claims
- 0981US6403497B1Method of manufacturing semiconductor device by two stage heating of deposited noncrystalline semiconductorSEIKO EPSON CORP·Filed 2000·Granted Jun 11, 2002·20 cites·13 claims
- 1079US8878134B2Photoconductive antenna, terahertz wave generating device, camera, imaging device, and measuring deviceSEIKO EPSON CORP·Filed 2012·Granted Nov 4, 2014·3 cites·24 claims
- 1173US6767772B2Active matrix substrate, electrooptical device, and method of producing active matrix substrateSEIKO EPSON CORP·Filed 2003·Granted Jul 27, 2004·15 cites·6 claims
- 1272US9513212B2Photoconductive antenna, camera, imaging device, and measurement deviceSEIKO EPSON CORP·Filed 2015·Granted Dec 6, 2016·1 cites·20 claims
- 1369US9397478B2Vertical cavity surface emitting laser and atomic oscillatorSEIKO EPSON CORP·Filed 2014·Granted Jul 19, 2016·2 cites·4 claims
- 1469US5834827AThin film semiconductor device, fabrication method thereof, electronic device and its fabrication methodSEIKO EPSON CORP·Filed 1996·Granted Nov 10, 1998·29 cites·6 claims
- 1569US4246342AProcess for the manufacture of pyruvate oxidase, and analytical method and kit for the use of the sameTOYO JOZO KK·Filed 1979·Granted Jan 20, 1981·15 cites·10 claims
- 1658US2023348759A1Film, and method for manufacturing semiconductor packageAGC INC·Filed 2023·Application pending·0 cites
- 1757US9349917B2Photoconductive antenna, terahertz wave generating device, camera, imaging device, and measuring deviceSEIKO EPSON CORP·Filed 2015·Granted May 24, 2016·0 cites·20 claims
- 1857US9130118B2Photoconductive antenna, terahertz wave generating device, camera, imaging device, and measuring deviceSEIKO EPSON CORP·Filed 2014·Granted Sep 8, 2015·0 cites·19 claims
- 1954US9451184B2Photo conductive antenna, camera, imaging apparatus, and measurement apparatusSEIKO EPSON CORP·Filed 2014·Granted Sep 20, 2016·0 cites·19 claims
- 2052US6882016B2Semiconductor device, electro-optical device, electronic apparatus, and method for manufacturing semiconductor deviceSEIKO EPSON CORP·Filed 2003·Granted Apr 19, 2005·5 cites·11 claims
- 2151US2023395398A1Film, method for manufacturing same, and method for manufacturing semiconductor packageAGC INC·Filed 2023·Application pending·0 cites
- 2248US6822777B2Semi-transparent reflective electro-optic apparatus and electronic equipment using the sameSEIKO EPSON CORP·Filed 2003·Granted Nov 23, 2004·2 cites·11 claims
- 2348US2019357775A1Biometric apparatusSEIKO EPSON CORP·Filed 2019·Application pending·0 cites
- 2448US2025197577A1Layered body, method for manufacturing same, and method for manufacturing semiconductor packageAGC INC·Filed 2025·Application pending·0 cites
- 2547US9197034B2Vertical cavity surface emitting laser and atomic oscillatorSEIKO EPSON CORP·Filed 2014·Granted Nov 24, 2015·0 cites·4 claims
- 2647US2017056924A1Nonflammable sheet and method for manufacturing the sameTOPPAN PRINTING CO LTD·Filed 2016·Application pending·0 cites
- 2744US9634467B2Vertical cavity surface emitting laser and atomic oscillatorSEIKO EPSON CORP·Filed 2014·Granted Apr 25, 2017·0 cites·6 claims
- 2843US6910018B1Purchase request approving apparatus, method, and storage medium storing sameCANON KK·Filed 1999·Granted Jun 21, 2005·53 cites·21 claims
- 2941US2002132452A1Semiconductor device and method of manufacturing the sameFiled 2002·Application pending·0 cites
- 3038US2015214415A1Photoconductive antenna, camera, imaging device, and measurement deviceSEIKO EPSON CORP·Filed 2015·Application pending·0 cites
- 3138US2015228840A1Photoconductive antenna, camera, imaging device, and measurement deviceSEIKO EPSON CORP·Filed 2015·Application pending·0 cites
- 3234US6763335B1Purchase request apparatus and systemCANON KK·Filed 1999·Granted Jul 13, 2004·22 cites·5 claims
- 3330US5070049AStarting composition for the production of silicon carbide and method of producing the sameIBIDEN CO LTD·Filed 1988·Granted Dec 3, 1991·3 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →