Inventor · disambiguated record
Satoru Yamaguchi
Also filed as: YAMAGUCHI SATORU
83 granted patents·14 pending applications·1,836 citations·filing 1974–2023
99Inventor score
Top patents by PatentIndex Score
97 records- 0194US6732124B1Data processing system with mechanism for restoring file systems based on transaction logsFUJITSU LTD·Filed 2000·Granted May 4, 2004·1.1k cites·9 claims
- 0293US6864493B2Charged particle beam alignment method and charged particle beam apparatusHITACHI LTD·Filed 2002·Granted Mar 8, 2005·36 cites·24 claims
- 0393US4551634AMultiplexing input circuitFUJITSU LTD·Filed 1983·Granted Nov 5, 1985·49 cites·6 claims
- 0492US6627888B2Scanning electron microscopeHITACHI LTD·Filed 2001·Granted Sep 30, 2003·30 cites·9 claims
- 0589US7355174B2Charged particle beam emitting device and method for adjusting the optical axisHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 8, 2008·10 cites·8 claims
- 0689US4753423ASynthetic resin-coated spring and method for making sameNIPPON PETROCHEMICALS CO LTD·Filed 1986·Granted Jun 28, 1988·59 cites·15 claims
- 0788US6932932B2Method of fabricating honeycomb bodyDENSO CORP·Filed 2002·Granted Aug 23, 2005·21 cites·10 claims
- 0886US7773145B2Auto focus unit and cameraHOYA CORP·Filed 2007·Granted Aug 10, 2010·10 cites·20 claims
- 0986US7034296B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2001·Granted Apr 25, 2006·24 cites·17 claims
- 1084US4624883AMagnetic recording mediumHITACHI MAXELL·Filed 1984·Granted Nov 25, 1986·29 cites·5 claims
- 1181US6432341B1Production method of ceramic moldingsDENSO CORP·Filed 2000·Granted Aug 13, 2002·16 cites·6 claims
- 1280US7101166B2Apparatus for extruding ceramic moldingDENSO CORP·Filed 2003·Granted Sep 5, 2006·15 cites·16 claims
- 1379US6790025B2Extrusion molding apparatusDENSO CORP·Filed 2001·Granted Sep 14, 2004·15 cites·13 claims
- 1478US9336587B2Semiconductor circuit pattern measuring apparatus and methodHITACHI HIGH TECH CORP·Filed 2013·Granted May 10, 2016·5 cites·11 claims
- 1578US7800059B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 21, 2010·3 cites·6 claims
- 1678US7504627B2Electron beam inspection apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 17, 2009·4 cites·10 claims
- 1777US7826735B2Auto focus unit and digital cameraHOYA CORP·Filed 2007·Granted Nov 2, 2010·5 cites·20 claims
- 1877US7439505B2Scanning electron microscopeHITACHI LTD·Filed 2005·Granted Oct 21, 2008·2 cites·7 claims
- 1977US7256400B2Electron beam inspection apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 14, 2007·4 cites·12 claims
- 2077US6638051B2Extrusion molding machine for producing ceramic moldingDENSO CORP·Filed 2001·Granted Oct 28, 2003·14 cites·9 claims
- 2176US8844971B2Vehicle body structure for automobileTANAKA HIROFUMI·Filed 2012·Granted Sep 30, 2014·7 cites·4 claims
- 2276US7605381B2Charged particle beam alignment method and charged particle beam apparatusHITACHI LTD·Filed 2003·Granted Oct 20, 2009·9 cites·7 claims
- 2376US7166840B2Method for determining depression/protrusion of sample and charged particle beam apparatus thereforHITACHI LTD·Filed 2005·Granted Jan 23, 2007·3 cites·4 claims
- 2476US6872943B2Method for determining depression/protrusion of sample and charged particle beam apparatus thereforHITACHI LTD·Filed 2002·Granted Mar 29, 2005·10 cites·18 claims
- 2575US7633063B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Dec 15, 2009·3 cites·14 claims
- 2675US5803487AAir bag apparatus for vehicleALLIED SIGNAL INC·Filed 1997·Granted Sep 8, 1998·48 cites·14 claims
- 2774US9000365B2Pattern measuring apparatus and computer programMOCHIZUKI YUZURU·Filed 2010·Granted Apr 7, 2015·5 cites·7 claims
- 2873US7361894B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 22, 2008·6 cites·10 claims
- 2971US10620421B2Image-forming device, and dimension measurement deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 14, 2020·1 cites·5 claims
- 3071US7652249B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Jan 26, 2010·2 cites·22 claims
- 3171US4747079AWrite circuit for an erasable programmable read only memory device of a microcomputerFUJITSU LTD·Filed 1986·Granted May 24, 1988·27 cites·10 claims
- 3270US10545017B2Overlay error measuring device and computer program for causing computer to measure patternHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 28, 2020·2 cites·14 claims
- 3370US8608238B2Vehicle body structure for automobileTANAKA HIROFUMI·Filed 2012·Granted Dec 17, 2013·5 cites·8 claims
- 3470US6709704B2Method of sealing cells of ceramic honeycomb bodyDENSO CORP·Filed 2001·Granted Mar 23, 2004·7 cites·3 claims
- 3570US6652257B2Apparatus for producing ceramic moldingsDENSO CORP·Filed 2002·Granted Nov 25, 2003·10 cites·6 claims
- 3667US8434816B2Vehicle body structure for automobileTANAKA HIROFUMI·Filed 2012·Granted May 7, 2013·4 cites·8 claims
- 3766US10976536B2Image-forming device, and dimension measurement deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Apr 13, 2021·0 cites·6 claims
- 3866US10197783B2Image-forming device, and dimension measurement deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 5, 2019·1 cites·4 claims
- 3966US8263935B2Charged particle beam apparatusTAKANE ATSUSHI·Filed 2009·Granted Sep 11, 2012·1 cites·23 claims
- 4065US10984980B2Charged particle beam device for imaging vias inside trenchesHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 20, 2021·1 cites·8 claims
- 4165US10874019B2Display deviceJAPAN DISPLAY INC·Filed 2019·Granted Dec 22, 2020·0 cites·4 claims
- 4265US10417756B2Pattern measurement apparatus and defect inspection apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 17, 2019·1 cites·5 claims
- 4365US9119287B2Display device and electronic apparatusJAPAN DISPLAY INC·Filed 2014·Granted Aug 25, 2015·3 cites·4 claims
- 4465US7101165B2Extrusion molding apparatus for ceramic molded productDENSO CORP·Filed 2003·Granted Sep 5, 2006·6 cites·8 claims
- 4563US10545018B2Pattern measurement device, and computer program for measuring patternHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 28, 2020·1 cites·11 claims
- 4663US7164126B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2003·Granted Jan 16, 2007·5 cites·1 claims
- 4763US6803573B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Oct 12, 2004·6 cites·6 claims
- 4863US2010006755A1Charged particle beam alignment method and charged particle beam apparatusSATO MITSUGO·Filed 2009·Application pending·0 cites
- 4962US8953855B2Edge detection technique and charged particle radiation equipmentNAMAI HITOSHI·Filed 2009·Granted Feb 10, 2015·6 cites·8 claims
- 5062US8571130B2Transmitting apparatus and transmission methodYAMAGUCHI SATORU·Filed 2011·Granted Oct 29, 2013·2 cites·7 claims
Showing the top 50 of 97 patent records by PatentIndex Score.
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