Inventor · disambiguated record
Scot M. Graham
Also filed as: GRAHAM SCOT · GRAHAM SCOT M
14 granted patents·172 citations·filing 1980–2007
93Inventor score
Top patents by PatentIndex Score
14 records- 0181US6834019B2Isolation device over field in a memory deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 21, 2004·23 cites·66 claims
- 0280US6515925B2Balanced sense amplifier control for open digit line architecture memory devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 4, 2003·23 cites·73 claims
- 0379US7020039B2Isolation device over field in a memory deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 28, 2006·20 cites·84 claims
- 0473US7245548B2Techniques for reducing leakage current in memory devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Jul 17, 2007·17 cites·28 claims
- 0572US7142446B2Apparatus and method to reduce undesirable effects caused by a fault in a memory deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 28, 2006·15 cites·32 claims
- 0672US5031062AMethod and apparatus for reducing disk distortion under clamping load in a disk drive apparatusPRAIRIETEK CORP·Filed 1991·Granted Jul 9, 1991·24 cites·18 claims
- 0770US7257043B2Isolation device over field in a memory deviceMICRON TECHNOLOGY INC·Filed 2006·Granted Aug 14, 2007·5 cites·36 claims
- 0870US4343441AMagnetic tape reel clamp with extended center poleIBM·Filed 1980·Granted Aug 10, 1982·15 cites·2 claims
- 0965US6301172B1Gate voltage testkey for isolation transistorMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 9, 2001·12 cites·46 claims
- 1060US6816425B2Balanced sense amplifier control for open digit line architecture memory devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 9, 2004·8 cites·11 claims
- 1155US6556467B2Gate voltage testkey for isolation transistorMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 29, 2003·7 cites·33 claims
- 1248US7746720B2Techniques for reducing leakage current in memory devicesMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 29, 2010·1 cites·27 claims
- 1342US6717873B2Balanced sense amplifier control for open digit line architecture memory devicesMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 6, 2004·2 cites·16 claims
- 1441US7336522B2Apparatus and method to reduce undesirable effects caused by a fault in a memory deviceMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 26, 2008·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →