Inventor · disambiguated record
Seigo Ando
Also filed as: ANDO SEIGO · MIYASHITA YOSHIO
32 granted patents·895 citations·filing 1974–2012
98Inventor score
Files withNIPPON KOKAN KK21ISHIBASHI TADAO4NTT ELECTRONICS CORP3NIPPON TELEGRAPH & TELEPHONE2KATSUYUKI NISHIFUJI1
Top patents by PatentIndex Score
32 records- 0196US6920166B2Thin film deposition method of nitride semiconductor and nitride semiconductor light emitting deviceNIPPON TELEGRAPH & TELEPHONE·Filed 2003·Granted Jul 19, 2005·252 cites·20 claims
- 0296US4647854AApparatus for measuring the level of the molten metal in the mold of a continuous casting machineNIPPON KOKAN KK·Filed 1984·Granted Mar 3, 1987·45 cites·4 claims
- 0390US3997835AMethod and apparatus for measuring distanceNIPPON KOKAN KK·Filed 1974·Granted Dec 14, 1976·43 cites·10 claims
- 0488US4716366AEddy current distance signal apparatus with temperature change compensation meansNIPPON KOKAN KK·Filed 1985·Granted Dec 29, 1987·66 cites·9 claims
- 0587US4186792AApparatus for monitoring and controlling the level of the molten metal in the mold of a continuous casting machineNIPPON KOKAN KK·Filed 1977·Granted Feb 5, 1980·23 cites·1 claims
- 0686US7557387B2Avalanche photodiodeNIPPON TELEGRAPH & TELEPHONE·Filed 2005·Granted Jul 7, 2009·12 cites·3 claims
- 0783US8575650B2Avalanche photodiodeISHIBASHI TADAO·Filed 2009·Granted Nov 5, 2013·8 cites·5 claims
- 0880US5537038AMagnetic flux measuring method and apparatus for detecting high frequency components of magnetic flux with high speed orientationNIPPON KOKAN KK·Filed 1995·Granted Jul 16, 1996·48 cites·9 claims
- 0979US4742298AApparatus for detecting surface flaw of pipeline by electromagnetic inductionNIPPON KOKAN KK·Filed 1986·Granted May 3, 1988·50 cites·5 claims
- 1078US4095469ATemperature measuring apparatusNIPPON KOKAN KK·Filed 1977·Granted Jun 20, 1978·34 cites·5 claims
- 1178US4019131AMethod and apparatus for measuring the shape of the wavy edges of metal strips using a detection coil controlled to track the strip edgeNIPPON KOKAN KK·Filed 1975·Granted Apr 19, 1977·15 cites·10 claims
- 1275US4030027AApparatus for non-contact measurement of distance from a metallic body using a detection coil in the feedback circuit of an amplifierNIPPON KOKAN KK·Filed 1975·Granted Jun 14, 1977·24 cites·6 claims
- 1374US5151793ARecording medium playing apparatusPIONEER ELECTRONIC CORP·Filed 1990·Granted Sep 29, 1992·44 cites·5 claims
- 1473US4303883AApparatus for detecting the center of a welded seam in accordance with fundamental harmonic component suppressionNIPPON KOKAN KK·Filed 1979·Granted Dec 1, 1981·25 cites·6 claims
- 1572US5512821AMethod and apparatus for magnetically detecting defects in an object with compensation for magnetic field shift by means of a compensating coilNIPPON KOKAN KK·Filed 1992·Granted Apr 30, 1996·43 cites·28 claims
- 1671US4309902AMethod for continuously measuring steepness of defective flatness of metal strip during rollingNIPPON KOKAN KK·Filed 1979·Granted Jan 12, 1982·21 cites·1 claims
- 1769US7880197B2Avalanche photodiode having doping region with monotonically increasing concentration distributionNTT ELECTRONICS CORP·Filed 2006·Granted Feb 1, 2011·2 cites·4 claims
- 1868US8754445B2Semiconductor deviceISHIBASHI TADAO·Filed 2012·Granted Jun 17, 2014·3 cites·7 claims
- 1964US5287059ASaturable core magnetometer with a parallel resonant circuit in which the W3 DC level changes with a change in an external magnetic fieldNIPPON KOKAN KK·Filed 1991·Granted Feb 15, 1994·24 cites·4 claims
- 2064US4567435AMethod and apparatus for continuously measuring distance utilizing eddy current and having temperature difference influence eliminationNIPPON KOKAN KK·Filed 1984·Granted Jan 28, 1986·17 cites·2 claims
- 2163US4267508AApparatus for non-contact measurement of distance from a metallic body using a detection coil in the feedback circuit of an amplifierNIPPON KOKAN KK·Filed 1979·Granted May 12, 1981·15 cites·4 claims
- 2256US5357198AApparatus for magnetic inspection using magnetic shieldNIPPON KOKAN KK·Filed 1992·Granted Oct 18, 1994·18 cites·14 claims
- 2354US7787736B2Semiconductor optoelectronic waveguideNTT ELECTRONICS CORP·Filed 2008·Granted Aug 31, 2010·0 cites·7 claims
- 2453US9006854B2Avalanche photodiodeISHIBASHI TADAO·Filed 2011·Granted Apr 14, 2015·0 cites·1 claims
- 2553US8729602B2Avalanche photodiodeISHIBASHI TADAO·Filed 2011·Granted May 20, 2014·0 cites·4 claims
- 2652US5132608ACurrent measuring method and apparatus thereforKATSUYUKI NISHIFUJI·Filed 1990·Granted Jul 21, 1992·19 cites·1 claims
- 2746US7599595B2Semiconductor optoelectronic waveguideNTT ELECTRONICS CORP·Filed 2004·Granted Oct 6, 2009·0 cites·13 claims
- 2846US5502382AApparatus for magnetic inspection using magnetic shield, with specific relation of distance E between magnetic sensors and distance L between each magnetic sensor and the object to be inspected, to obtain optimum S/NNIPPON KOKAN KK·Filed 1994·Granted Mar 26, 1996·11 cites·1 claims
- 2942US5235275AMagnetic inspection apparatus for thin steel strip having magnetizer and detection coil within a hollow roller rotated by the steel stripNIPPON KOKAN KK·Filed 1991·Granted Aug 10, 1993·14 cites·3 claims
- 3040US3995211AElectromagnetic induction type detectorsNIPPON KOKAN KK·Filed 1975·Granted Nov 30, 1976·7 cites·3 claims
- 3140US3946307AApparatus for detecting the physical properties of magnetic or electric conductive heat-responsive or deformable material using negative input impedance networkNIPPON KOKAN KK·Filed 1974·Granted Mar 23, 1976·7 cites·18 claims
- 3236US4050011AEddy current flaw detector using a pair of parallel resonant circuits and a negative resistance in parallel with each circuitNIPPON KOKAN KK·Filed 1975·Granted Sep 20, 1977·5 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →