Inventor · disambiguated record
Seung Hun Baik
Also filed as: BAIK SEUNG HUN
1 granted patent·2 pending applications·0 citations·filing 2020–2021
8Inventor score
Technology areasG01Q
Files withPARK SYSTEMS CORP3
Top patents by PatentIndex Score
3 records- 0149US12399195B2Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same methodPARK SYSTEMS CORP·Filed 2021·Granted Aug 26, 2025·0 cites·11 claims
- 0239US2023324434A1Method for measuring characteristics of surface of object to be measured by means of measuring apparatus using variable set point setting, atomic microscope for performing method, and computer program stored in storage medium for performing methodPARK SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 0338US2023046236A1Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform methodPARK SYSTEMS CORP·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →