Inventor · disambiguated record
See Jean Chan
Also filed as: CHAN SEE JEAN
6 granted patents·2 pending applications·20 citations·filing 2015–2022
76Inventor score
Files withAEM SINGAPORE PTE LTD8
Top patents by PatentIndex Score
8 records- 0193US11129297B2Cold plate with porus thermal conductive structureAEM SINGAPORE PTE LTD·Filed 2020·Granted Sep 21, 2021·7 cites·13 claims
- 0291US11454666B2Thermal test head for an integrated circuit deviceAEM SINGAPORE PTE LTD·Filed 2020·Granted Sep 27, 2022·10 cites·20 claims
- 0388US11706902B2Cold plate with porous thermal conductive structureAEM SINGAPORE PTE LTD·Filed 2021·Granted Jul 18, 2023·2 cites·19 claims
- 0476US11378615B2Thermal test head for an integrated circuit deviceAEM SINGAPORE PTE LTD·Filed 2020·Granted Jul 5, 2022·1 cites·18 claims
- 0549US2024385237A1Device and thermal tester for thermal testing dies of an integrated circuitAEM SINGAPORE PTE LTD·Filed 2022·Application pending·0 cites
- 0632US11181575B2Compact testerAEM SINGAPORE PTE LTD·Filed 2020·Granted Nov 23, 2021·0 cites·20 claims
- 0731US2018354142A1Automated picking apparatus with magnetic repulsion for picking an object or a set of objects and method thereofAEM SINGAPORE PTE LTD·Filed 2016·Application pending·0 cites
- 0824US9927478B2Configurable electronic device tester systemAEM SINGAPORE PTE LTD·Filed 2015·Granted Mar 27, 2018·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →