Inventor · disambiguated record
Sean Hand
Also filed as: HAND SEAN · HAND SEAN MICHAEL
6 granted patents·1 pending application·4 citations·filing 2015–2023
70Inventor score
Technology areasG01Q
Files withBRUKER NANO INC7
Top patents by PatentIndex Score
7 records- 0179US11796565B2AFM imaging with metrology-preserving real time denoisingBRUKER NANO INC·Filed 2021·Granted Oct 24, 2023·1 cites·15 claims
- 0276US10969406B2High speed atomic force profilometry of large areasBRUKER NANO INC·Filed 2019·Granted Apr 6, 2021·1 cites·19 claims
- 0370US9995763B2Precise probe placement in automated scanning probe microscopy systemsBRUKER NANO INC·Filed 2015·Granted Jun 12, 2018·2 cites·23 claims
- 0464US11668730B2High speed atomic force profilometry of large areasBRUKER NANO INC·Filed 2021·Granted Jun 6, 2023·0 cites·7 claims
- 0555US11714104B2AFM imaging with creep correctionBRUKER NANO INC·Filed 2021·Granted Aug 1, 2023·0 cites·16 claims
- 0655US11604210B2AFM imaging with real time drift correctionBRUKER NANO INC·Filed 2021·Granted Mar 14, 2023·0 cites·15 claims
- 0752US2023400781A1Method of Analyzing Metrology DataBRUKER NANO INC·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →