Inventor · disambiguated record
Seiji Heike
Also filed as: HEIKE SEIJI
9 granted patents·3 pending applications·153 citations·filing 1994–2012
86Inventor score
Top patents by PatentIndex Score
12 records- 0186US5801472AMicro-fabricated device with integrated electrostatic actuatorHITCHI LTD·Filed 1996·Granted Sep 1, 1998·98 cites·32 claims
- 0277US6366340B1Electron exposure apparatusHITACHI LTD·Filed 1998·Granted Apr 2, 2002·28 cites·21 claims
- 0358US6670622B2Electron exposure device and method and electronic characteristics evaluation device using scanning probeHITACHI LTD·Filed 2002·Granted Dec 30, 2003·3 cites·12 claims
- 0455US9423416B2Scanning probe microscope and measuring method using sameNAMBU AKIRA·Filed 2012·Granted Aug 23, 2016·1 cites·15 claims
- 0554US7557662B2Oscillator and frequency detectorHITACHI LTD·Filed 2007·Granted Jul 7, 2009·3 cites·7 claims
- 0654US5694059ABuffer of fine connection structure for connecting an atom level circuit and a general semiconductor circuitHITACHI LTD·Filed 1995·Granted Dec 2, 1997·18 cites·12 claims
- 0751US7799701B2Method of coating substrateHITACHI LTD·Filed 2008·Granted Sep 21, 2010·0 cites·4 claims
- 0842US2012185173A1Neural activity measurement systemYAMAMOTO TSUYOSHI·Filed 2012·Application pending·0 cites
- 0938US2015192604A1Holder for probe microscope, probe microscope and specimen measurement methodYAMAMOTO TSUYOSHI·Filed 2012·Application pending·0 cites
- 1032US5510614ASolid surface observation method and apparatus therefor, and electronic apparatus formed of the solid surface observation apparatus and method of forming the electronic apparatusHITACHI LTD·Filed 1994·Granted Apr 23, 1996·2 cites·17 claims
- 1131US2002101573A1Electron exposure apparatusHITACHI LTD·Filed 2002·Application pending·0 cites
- 1230US8912789B2Magnetic force microscope and magnetic field observation method using sameHEIKE SEIJI·Filed 2012·Granted Dec 16, 2014·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →