Inventor · disambiguated record
Seiichiro Ishio
Also filed as: ISHIO SEIICHIRO
28 granted patents·1 pending application·934 citations·filing 1996–2008
97Inventor score
Top patents by PatentIndex Score
29 records- 0198US6422088B1Sensor failure or abnormality detecting system incorporated in a physical or dynamic quantity detecting apparatusDENSO CORP·Filed 2000·Granted Jul 23, 2002·142 cites·64 claims
- 0297US7355388B2Rotation detecting device using magnetic sensorDENSO CORP·Filed 2006·Granted Apr 8, 2008·64 cites·14 claims
- 0395US6065341ASemiconductor physical quantity sensor with stopper portionDENSO CORP·Filed 1998·Granted May 23, 2000·130 cites·30 claims
- 0494US6744258B2Capacitive sensor apparatusDENSO CORP·Filed 2002·Granted Jun 1, 2004·63 cites·10 claims
- 0591US6199430B1Acceleration sensor with ring-shaped movable electrodeDENSO CORP·Filed 1999·Granted Mar 13, 2001·77 cites·48 claims
- 0689US6584852B2Electrical capacitance pressure sensor having electrode with fixed area and manufacturing method thereofDENSO CORPORTATION·Filed 2002·Granted Jul 1, 2003·49 cites·22 claims
- 0785US7141966B2Rotation detecting apparatusDENSO CORP·Filed 2005·Granted Nov 28, 2006·14 cites·17 claims
- 0883US6640643B2Capacitive pressure sensor with multiple capacitive portionsDENSO CORP·Filed 2002·Granted Nov 4, 2003·27 cites·9 claims
- 0983US6521966B1Semiconductor strain sensorDENSO CORP·Filed 2000·Granted Feb 18, 2003·37 cites·10 claims
- 1083US6495389B2Method for manufacturing semiconductor pressure sensor having reference pressure chamberDENSO CORP·Filed 2001·Granted Dec 17, 2002·32 cites·7 claims
- 1178US7253601B2Current sensor having hall elementDENSO CORP·Filed 2006·Granted Aug 7, 2007·9 cites·9 claims
- 1278US6789431B2Diaphragm-type semiconductor pressure sensorDENSO CORP·Filed 2003·Granted Sep 14, 2004·20 cites·13 claims
- 1378US6653702B2Semiconductor pressure sensor having strain gauge and circuit portion on semiconductor substrateDENSO CORP·Filed 2001·Granted Nov 25, 2003·24 cites·2 claims
- 1475US6925885B2Pressure sensorDENSO CORP·Filed 2002·Granted Aug 9, 2005·21 cites·13 claims
- 1573US6694814B2Dynamic sensor having capacitance varying according to dynamic force applied theretoDENSO CORP·Filed 2001·Granted Feb 24, 2004·26 cites·10 claims
- 1673US6448624B1Semiconductor acceleration sensorDENSO CORP·Filed 1997·Granted Sep 10, 2002·47 cites·50 claims
- 1772US6802222B2Diaphragm-type semiconductor device and method for manufacturing diaphragm-type semiconductor deviceDENSO CORP·Filed 2002·Granted Oct 12, 2004·16 cites·15 claims
- 1871US6897669B2Semiconductor device having bonding pads and probe padsDENSO CORP·Filed 2003·Granted May 24, 2005·17 cites·6 claims
- 1967US5869876ASemiconductor strain sensorDENSO CORP·Filed 1997·Granted Feb 9, 1999·27 cites·5 claims
- 2064US6933582B2Semiconductor sensor having a diffused resistorDENSO CORP·Filed 2003·Granted Aug 23, 2005·11 cites·12 claims
- 2163US6686634B2Semiconductor device and a method of producing the sameDENSO CORP·Filed 2002·Granted Feb 3, 2004·9 cites·13 claims
- 2263US6270685B1Method for producing a semiconductorDENSO CORP·Filed 1999·Granted Aug 7, 2001·23 cites·8 claims
- 2359US7105910B2Semiconductor device having SOI constructionDENSO CORP·Filed 2004·Granted Sep 12, 2006·9 cites·35 claims
- 2459US6875673B2Method of producing semiconductor deviceDENSO CORP·Filed 2003·Granted Apr 5, 2005·7 cites·1 claims
- 2556US6809527B2Method of measuring a characteristic of a capacitive type of sensor, a sensor characteristic measuring apparatus, a capacitive type of sensor apparatus, and an ic chip for measuring a sensor characteristicDENSO CORP·Filed 2002·Granted Oct 26, 2004·7 cites·7 claims
- 2651US6647795B2Capacitive physical load sensor and detection systemDENSO CORP·Filed 2002·Granted Nov 18, 2003·6 cites·7 claims
- 2748US6143584AMethod for fabrication of a semiconductor sensorDENSO CORP·Filed 1998·Granted Nov 7, 2000·12 cites·42 claims
- 2846US2009057795A1Sensor chip having conductivity filmDENSO CORP·Filed 2008·Application pending·0 cites
- 2942US6130010AMethod for producing a semiconductor dynamic sensor using an anisotropic etching maskDENSO CORP·Filed 1996·Granted Oct 10, 2000·8 cites·39 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →