Inventor · disambiguated record
Sebastian Jackisch
Also filed as: JACKISCH SEBASTIAN
8 granted patents·6 pending applications·17 citations·filing 2006–2015
80Inventor score
Top patents by PatentIndex Score
14 records- 0180US10401532B2Location device and method for operating a location deviceBOSCH GMBH ROBERT·Filed 2015·Granted Sep 3, 2019·2 cites·17 claims
- 0277US8154155B2Machine tool protection apparatusSEIDEL JUERGEN·Filed 2009·Granted Apr 10, 2012·8 cites·17 claims
- 0365US8432292B2Machine toolVISEL BENJAMIN·Filed 2009·Granted Apr 30, 2013·3 cites·14 claims
- 0459US8575549B2Machine tool monitoring deviceVISEL BENJAMIN·Filed 2008·Granted Nov 5, 2013·2 cites·10 claims
- 0552US8474356B2Machine tool monitoring deviceSTELLMANN GEORG·Filed 2008·Granted Jul 2, 2013·1 cites·10 claims
- 0647US9154769B2Parallel online-offline reconstruction for three-dimensional space measurementROLAND MATTHIAS·Filed 2011·Granted Oct 6, 2015·1 cites·11 claims
- 0747US2011088528A1Machine Tool Monitoring DeviceBOSCH GMBH ROBERT·Filed 2008·Application pending·0 cites
- 0845US2010300257A1Machine toolLOEWE ANDREAS·Filed 2008·Application pending·0 cites
- 0945US2010300256A1Machine tool safety deviceLOEWE ANDREAS·Filed 2008·Application pending·0 cites
- 1041US9242328B2Monitoring device of a machine toolSTELLMANN GEORG·Filed 2010·Granted Jan 26, 2016·0 cites·14 claims
- 1141US8701534B2Machine toolVISEL BENJAMIN·Filed 2008·Granted Apr 22, 2014·0 cites·13 claims
- 1237US2009219515A1Interferometic Measuring DeviceSPENNEMANN HARTMUT·Filed 2006·Application pending·0 cites
- 1337US2013187026A1Monitoring Device of a Machine ToolJACKISCH SEBASTIAN·Filed 2010·Application pending·0 cites
- 1437US2009296099A1Interferometric Layer Thickness DeterminationBURGER KURT·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →