Inventor · disambiguated record
Seongtae Jeong
Also filed as: JEONG SEONGTAE
7 granted patents·6 pending applications·112 citations·filing 1999–2025
83Inventor score
Top patents by PatentIndex Score
13 records- 0190US8404403B2Mask design and OPC for device manufactureOGADHOH SHEM·Filed 2010·Granted Mar 26, 2013·10 cites·31 claims
- 0283US6484306B1Multi-level scanning method for defect inspectionUNIV CALIFORNIA·Filed 1999·Granted Nov 19, 2002·89 cites·15 claims
- 0378US8778605B2Mask design and OPC for device manufactureOGADHOH SHEM·Filed 2013·Granted Jul 15, 2014·3 cites·4 claims
- 0471US7691544B2Measurement of a scattered light point spread function (PSF) for microelectronic photolithographyINTEL CORP·Filed 2006·Granted Apr 6, 2010·4 cites·19 claims
- 0566US8959465B2Techniques for phase tuning for process optimizationNYHUS PAUL A·Filed 2011·Granted Feb 17, 2015·1 cites·23 claims
- 0661US9679845B2Necked interconnect fuse structure for integrated circuitsINTEL CORP·Filed 2014·Granted Jun 13, 2017·1 cites·20 claims
- 0761US2025265753A1Method of training vector image generator modelSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0860US2025306454A1Apparatus and method for correcting mask for fabricating semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0958US2024231217A9Enhanced mask pattern-aware heuristics for optical proximity corrections for integrated circuitsINTEL CORP·Filed 2022·Application pending·0 cites
- 1054US7254803B2Test structures for feature fidelity improvementINTEL CORP·Filed 2004·Granted Aug 7, 2007·4 cites·50 claims
- 1153US2025321478A1Detection method of weak point and verification method of mask qualitySAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1239US2014132467A1Antenna using slot in mobile terminalSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 1331US2006051680A1Combining image imbalance compensation and optical proximity correction in designing phase shift masksTRITCHKOV ALEXANDER V·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →