Inventor · disambiguated record
Seiji Kajihara
Also filed as: KAJIHARA SEIJI
18 granted patents·79 citations·filing 2001–2013
91Inventor score
Files withJAPAN SCIENCE & TECH AGENCY5KYUSHU INST TECHNOLOGY5MIYASE KOHEI3MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2SATO YASUO2
Top patents by PatentIndex Score
18 records- 0186US6799292B2Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Sep 28, 2004·40 cites·6 claims
- 0279US7743306B2Test vector generating method and test vector generating program of semiconductor logic circuit deviceKYUSHU INST TECHNOLOGY·Filed 2006·Granted Jun 22, 2010·10 cites·16 claims
- 0377US7962822B2Generating device, generating method, program and recording mediumJAPAN SCIENCE & TECH AGENCY·Filed 2008·Granted Jun 14, 2011·9 cites·19 claims
- 0464US7979765B2Generating device, generating method, program and recording mediumJAPAN SCIENCE & TECH AGENCY·Filed 2007·Granted Jul 12, 2011·6 cites·10 claims
- 0563US8001437B2Test pattern generation method for avoiding false testing in two-pattern testing for semiconductor integrated circuitKYUSHU INST TECHNOLOGY·Filed 2008·Granted Aug 16, 2011·4 cites·3 claims
- 0661US7478295B2Method and apparatus of fault diagnosis for integrated logic circuitsKYUSHU INST TECHNOLOGY·Filed 2005·Granted Jan 13, 2009·3 cites·17 claims
- 0758US7971118B2Conversion device, conversion method, program, and recording mediumJAPAN SCIENCE & TECH AGENCY·Filed 2008·Granted Jun 28, 2011·3 cites·15 claims
- 0851US8037387B2Conversion device, conversion method, program, and recording mediumJAPAN SCIENCE & TECH AGENCY·Filed 2008·Granted Oct 11, 2011·2 cites·15 claims
- 0950US9316684B2Semiconductor device, detection method and programSATO YASUO·Filed 2011·Granted Apr 19, 2016·1 cites·11 claims
- 1048US7913144B2Diagnostic device, diagnostic method, program, and recording mediumJAPAN SCIENCE & TECH AGENCY·Filed 2007·Granted Mar 22, 2011·1 cites·13 claims
- 1145US9702927B2Test pattern generation device, fault detection system, test pattern generation method, program and recording mediumKYUSHU INST TECHNOLOGY·Filed 2013·Granted Jul 11, 2017·0 cites·9 claims
- 1243US8589751B2Don't-care-bit identification method and don't-care-bit identification programMIYASE KOHEI·Filed 2010·Granted Nov 19, 2013·0 cites·6 claims
- 1341US9383408B2Fault detection system, generation circuit, and programKYUSHU INST TECHNOLOGY·Filed 2013·Granted Jul 5, 2016·0 cites·8 claims
- 1440US9075110B2Fault detection system, acquisition apparatus, fault detection method, program, and non-transitory computer-readable mediumSATO YASUO·Filed 2011·Granted Jul 7, 2015·0 cites·12 claims
- 1537US7159143B2Method for evaluating delay test qualityMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jan 2, 2007·0 cites·20 claims
- 1632US8429472B2Generating device, generating method, and programMIYASE KOHEI·Filed 2009·Granted Apr 23, 2013·0 cites·7 claims
- 1731US8117513B2Test method and test program of semiconductor logic circuit deviceWEN XIAOQING·Filed 2006·Granted Feb 14, 2012·0 cites·16 claims
- 1830US8453023B2Target logic value determination method for unspecified bit in test vector for combinational circuit and non-transitory computer-readable mediumMIYASE KOHEI·Filed 2010·Granted May 28, 2013·0 cites·6 claims
Join the waitlist — get patent alerts
Get an alert when Seiji Kajihara files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →