Inventor · disambiguated record
Seiji Kamba
Also filed as: KAMBA SEIJI
23 granted patents·11 pending applications·59 citations·filing 2001–2022
93Inventor score
Top patents by PatentIndex Score
34 records- 0193US8514403B2Sample analysis methodOGAWA YUICHI·Filed 2011·Granted Aug 20, 2013·13 cites·16 claims
- 0288US10408750B2Void-arranged structure and measurement method using the sameMURATA MANUFACTURING CO·Filed 2015·Granted Sep 10, 2019·5 cites·5 claims
- 0388US8610071B2Method of measuring characteristics of specimen, and flat-plate periodic structureMURATA MANUFACTURING CO·Filed 2013·Granted Dec 17, 2013·8 cites·12 claims
- 0487US11041787B2Aperture array and production method thereforMURATA MANUFACTURING CO·Filed 2017·Granted Jun 22, 2021·4 cites·10 claims
- 0584US10266875B2Extraction method, analytical method, extraction device, and analytical deviceMURATA MANUFACTURING CO·Filed 2016·Granted Apr 23, 2019·2 cites·11 claims
- 0682US9329125B2Perforated-structure body, manufacturing method therefor, and measurement apparatus and measurement methodMURATA MANUFACTURING CO·Filed 2015·Granted May 3, 2016·2 cites·19 claims
- 0780US8304732B2Method of measuring characteristics of specimen and flat-plate periodic structureKAMBA SEIJI·Filed 2012·Granted Nov 6, 2012·5 cites·18 claims
- 0877US11833455B2Separation recovery system and separation recovery methodMURATA MANUFACTURING CO·Filed 2022·Granted Dec 5, 2023·0 cites·10 claims
- 0975US6630875B2Dual-mode band-pass filterMURATA MANUFACTURING CO·Filed 2002·Granted Oct 7, 2003·10 cites·12 claims
- 1070US6507251B2Dual-mode band-pass filterMURATA MANUFACTURING CO·Filed 2001·Granted Jan 14, 2003·9 cites·19 claims
- 1168US11202996B2Filtration filterMURATA MANUFACTURING CO·Filed 2019·Granted Dec 21, 2021·0 cites·16 claims
- 1264US2020298150A1Separation recovery system and separation recovery methodMURATA MANUFACTURING CO·Filed 2020·Application pending·0 cites
- 1362US10399042B2Filtration filterMURATA MANUFACTURING CO·Filed 2017·Granted Sep 3, 2019·0 cites·22 claims
- 1455US9075006B2Measurement device and feature measurement method of object to be measured employing sameMURATA MANUFACTURING CO·Filed 2014·Granted Jul 7, 2015·0 cites·15 claims
- 1553US2016054223A1Method for measuring analyteMURATA MANUFACTURING CO·Filed 2015·Application pending·0 cites
- 1653US2016041075A1Filter device and measuring apparatusMURATA MANUFACTURING CO·Filed 2015·Application pending·0 cites
- 1752US8912497B2Measurement structure, method of manufacturing same, and measuring method using sameMURATA MANUFACTURING CO·Filed 2013·Granted Dec 16, 2014·0 cites·18 claims
- 1851US10729993B2Filtration filterMURATA MANUFACTURING CO·Filed 2017·Granted Aug 4, 2020·0 cites·20 claims
- 1951US9366620B2Specimen measuring methodMURATA MANUFACTURING CO·Filed 2013·Granted Jun 14, 2016·0 cites·20 claims
- 2050US10408751B2Measurement method and measurement systemMURATA MANUFACTURING CO·Filed 2016·Granted Sep 10, 2019·0 cites·16 claims
- 2149US9341561B2Aperture array structure and measurement method using the sameMURATA MANUFACTURING CO·Filed 2015·Granted May 17, 2016·0 cites·18 claims
- 2249US2014247452A1Periodic structure and measurement method using the sameMURATA MANUFACTURING CO·Filed 2014·Application pending·0 cites
- 2346US8269967B2Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring deviceKAMBA SEIJI·Filed 2011·Granted Sep 18, 2012·0 cites·21 claims
- 2446US6545568B2Dual-mode band-pass filterMURATA MANUFACTURING CO·Filed 2001·Granted Apr 8, 2003·1 cites·11 claims
- 2545US9063078B2Method and apparatus for measuring characteristics of objectKONDO TAKASHI·Filed 2012·Granted Jun 23, 2015·0 cites·20 claims
- 2645US2013062524A1Method of measuring characteristics of specimen, and aperture array structure and measuring device used in sameMURATA MANUFACTURING CO·Filed 2012·Application pending·0 cites
- 2744US2013011935A1Method of measuring characteristics of specimen and sensing device for use with the sameMURATA MANUFACTURING CO·Filed 2012·Application pending·0 cites
- 2843US2012126123A1Method of Measuring Characteristics of Specimen, Measuring Device, and Filter DeviceKONDO TAKASHI·Filed 2012·Application pending·0 cites
- 2942US9007578B2Method for measurement of properties of analyteTAKIGAWA KAZUHIRO·Filed 2012·Granted Apr 14, 2015·0 cites·8 claims
- 3038US10215947B2Fixing instrument and metal mesh deviceMURATA MANUFACTURING CO·Filed 2016·Granted Feb 26, 2019·0 cites·17 claims
- 3138US2015323453A1Void-arranged structure and measurement methodMURATA MANUFACTURING CO·Filed 2015·Application pending·0 cites
- 3237US2015211996A1Droplet quantity determination method and measuring deviceMURATA MANUFACTURING CO·Filed 2015·Application pending·0 cites
- 3333US2015129769A1Measurement Method for Object to be MeasuredMURATA MANUFACTURING CO·Filed 2015·Application pending·0 cites
- 3433US2015123001A1Measurement method for object to be measured and measurement device used thereofMURATA MANUFACTURING CO·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Seiji Kamba files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →