Inventor · disambiguated record

See Kei Lee

Also filed as: LEE SEE KEI

2 granted patents·0 citations·filing 2020–2020

24Inventor score

Technology areasG01Q H01J

Files withKIOXIA CORP2

Top patents by PatentIndex Score

2 records

0156US11125775B1Probe and manufacturing method of probe for scanning probe microscopeKIOXIA CORP·Filed 2020·Granted Sep 21, 2021·0 cites·13 claims
0249US11069513B2Charged particle beam apparatusKIOXIA CORP·Filed 2020·Granted Jul 20, 2021·0 cites·20 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →