Inventor · disambiguated record
Seong Hwan Myung
Also filed as: MYUNG SEONG HWAN
7 granted patents·4 pending applications·16 citations·filing 2006–2008
75Inventor score
Top patents by PatentIndex Score
11 records- 0188US7629213B2Method of manufacturing flash memory device with void between gate patternsHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Dec 8, 2009·14 cites·8 claims
- 0260US7560340B2Method of manufacturing flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jul 14, 2009·1 cites·8 claims
- 0356US7652352B2Active structure of a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jan 26, 2010·1 cites·8 claims
- 0451US7897504B2Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 1, 2011·0 cites·6 claims
- 0548US7960231B2Method of forming a semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jun 14, 2011·0 cites·13 claims
- 0645US7482264B2Method of forming metal line of semiconductor device, and semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jan 27, 2009·0 cites·19 claims
- 0744US7521319B2Method of forming gate of flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Apr 21, 2009·0 cites·12 claims
- 0843US2008102622A1Method of forming metal line in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 0941US2008268608A1Method of fabricating a flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 1040US2008220605A1Method of manufacturing flash memory deviceLEE JUNG GU·Filed 2007·Application pending·0 cites
- 1140US2008003745A1Method of manufacturing a flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →