Inventor · disambiguated record
Seizo Nakamura
Also filed as: NAKAMURA SEIZO
12 granted patents·199 citations·filing 1985–1996
92Inventor score
Top patents by PatentIndex Score
12 records- 0179US4709741AMold material and process for casting of pure titanium or titanium alloyOHARA KK·Filed 1985·Granted Dec 1, 1987·14 cites·2 claims
- 0275US5654987AClock recovery circuit with reduced jitterOKI ELECTRIC IND CO LTD·Filed 1995·Granted Aug 5, 1997·40 cites·25 claims
- 0373US4700769ACasting apparatus for titanium or titanium alloyOHARA KK·Filed 1985·Granted Oct 20, 1987·14 cites·14 claims
- 0472US4830083AMold material and process for casting of pure titanium or titanium alloyOHARA KK·Filed 1987·Granted May 16, 1989·11 cites·11 claims
- 0551US5539355AFrequency-shift-keying detector using digital circuitsOKI ELECTRIC IND CO LTD·Filed 1995·Granted Jul 23, 1996·29 cites·55 claims
- 0651US4768757AApparatus for nitriding surface of shaped article of titaniumOHARA KK·Filed 1987·Granted Sep 6, 1988·21 cites·12 claims
- 0749US5703914AClock recovery circuit employing delay-and-difference circuit and pulse-sequence detectionOKI ELECTRIC IND CO LTD·Filed 1995·Granted Dec 30, 1997·27 cites·22 claims
- 0849US5036297AHigh-speed digital PLL deviceOKI ELECTRIC IND CO LTD·Filed 1990·Granted Jul 30, 1991·15 cites·7 claims
- 0946US5537442AInstantaneous phase detecting circuit and clock recovery signal generating circuit incorporated in differential demodulatorOKI ELECTRIC IND CO LTD·Filed 1993·Granted Jul 16, 1996·12 cites·3 claims
- 1037US4830823ADental titanium alloy castingsOHARA KK·Filed 1987·Granted May 16, 1989·5 cites·2 claims
- 1136US5668838AInstantaneous phase detecting circuit and clock recovery signal generating circuit incorporated in differential demodulatorOKI ELECTRIC IND CO LTD·Filed 1996·Granted Sep 16, 1997·6 cites·5 claims
- 1233US4939750AAdaptive signal discrimination circuit and a method for discriminating high and low level of data signalsOKI ELECTRIC IND CO LTD·Filed 1989·Granted Jul 3, 1990·5 cites·40 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →