Inventor · disambiguated record
Seungryeol Oh
Also filed as: OH SEUNGRYEOL
2 granted patents·1 pending application·1 citations·filing 2021–2024
30Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0179US11988495B2Through-focus image-based metrology device, operation method thereof, and computing device for executing the operationSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 21, 2024·1 cites·16 claims
- 0257US2025027875A1Optical imaging deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0355US12303307B2Semiconductor device measurement method using x-ray scattering and semiconductor device manufacturing method including the measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted May 20, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →