Inventor · disambiguated record

Sethi Satyendra

Also filed as: SATYENDRA SETHI

2 granted patents·147 citations·filing 1997–1997

69Inventor score

Technology areasG03F

Files withVLSI TECHNOLOGY INC2

Top patents by PatentIndex Score

2 records

0190US5902703AMethod for measuring dimensional anomalies in photolithographed integrated circuits using overlay metrology, and masks thereforVLSI TECHNOLOGY INC·Filed 1997·Granted May 11, 1999·97 cites·22 claims
0280US5962173AMethod for measuring the effectiveness of optical proximity correctionsVLSI TECHNOLOGY INC·Filed 1997·Granted Oct 5, 1999·50 cites·26 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →