Inventor · disambiguated record
Seongseob Shin
Also filed as: SHIN SEONGSEOB
2 granted patents·1 pending application·5 citations·filing 2017–2024
47Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0184US12510584B2Test board and test method for semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Dec 30, 2025·1 cites·19 claims
- 0268US10163525B2Test apparatus based on binary vectorSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Dec 25, 2018·4 cites·15 claims
- 0360US2025012854A1Test device and semiconductor manufacturing apparatus including test deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →