Inventor · disambiguated record
Seong Seob Shin
Also filed as: SHIN Seong-seob
4 granted patents·9 citations·filing 2017–2023
64Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0185US10088521B2Test board for semiconductor package, test system, and method of manufacturing semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 2, 2018·6 cites·22 claims
- 0275US10692583B2Multi-channel package, and test apparatus and test method of testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jun 23, 2020·3 cites·16 claims
- 0367US12461139B2Test device and test system for semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 4, 2025·0 cites·17 claims
- 0453US11959959B2Burn in board test device and systemSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 16, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →