Inventor · disambiguated record
Seiji Takeuchi
Also filed as: NAKAJIMA FUMITO · TAKEUCHI SEIJI
82 granted patents·14 pending applications·2,158 citations·filing 1976–2024
99Inventor score
Top patents by PatentIndex Score
96 records- 0199US5610715ADisplacement detecting system, an expose apparatus, and a device manufacturing method employing a scale whose displacement is detected by a selected detection headCANON KK·Filed 1995·Granted Mar 11, 1997·397 cites·7 claims
- 0297US5486919AInspection method and apparatus for inspecting a particle, if any, on a substrate having a patternCANON KK·Filed 1993·Granted Jan 23, 1996·155 cites·28 claims
- 0397US4178270AMethod for supporting hydrous metal oxide on carrierHITACHI LTD·Filed 1978·Granted Dec 11, 1979·59 cites·10 claims
- 0496US11497382B1Apparatus and method for endoscopic image orientation controlCANON USA INC·Filed 2021·Granted Nov 15, 2022·10 cites·20 claims
- 0596US7508493B2Exposure apparatus and device manufacturing methodCANON KK·Filed 2007·Granted Mar 24, 2009·30 cites·10 claims
- 0696US6638662B2Lithium secondary battery having oxide particles embedded in particles of carbonaceous material as a negative electrode-active materialHITACHI LTD·Filed 2000·Granted Oct 28, 2003·101 cites·20 claims
- 0795US4810597AFuel cell comprising a device for detecting the concentration of methanolHITACHI LTD·Filed 1985·Granted Mar 7, 1989·120 cites·13 claims
- 0894US6030726ALithium secondary battery having negative electrode of carbon material which bears metalsHITACHI LTD·Filed 1997·Granted Feb 29, 2000·109 cites·15 claims
- 0992US6524749B1Lithium secondary battery, and process for producing the sameHITACHI LTD·Filed 2000·Granted Feb 25, 2003·46 cites·7 claims
- 1091US12283921B2Methods and apparatus for driver calibrationSEMICONDUCTOR COMPONENTS IND LLC·Filed 2024·Granted Apr 22, 2025·0 cites·20 claims
- 1191US5767962AInspection system and device manufacturing method using the sameCANON KK·Filed 1996·Granted Jun 16, 1998·102 cites·7 claims
- 1291US4070284ALiquid chromatography and apparatus for the sameHITACHI LTD·Filed 1976·Granted Jan 24, 1978·60 cites·36 claims
- 1390US10658986B2Methods and apparatus for driver calibrationSEMICONDUCTOR COMPONENTS IND LLC·Filed 2018·Granted May 19, 2020·5 cites·20 claims
- 1490US4461402AContainer linerFELL DON LTD·Filed 1983·Granted Jul 24, 1984·113 cites·11 claims
- 1589US4894355AFlexible, water-repellent baked carbon plate, its production, fuel cell electrode, fuel cell electrode plate and its production and fuel cellHITACHI LTD·Filed 1988·Granted Jan 16, 1990·69 cites·20 claims
- 1688US12015381B2Methods and apparatus for driver calibrationSEMICONDUCTOR COMPONENTS IND LLC·Filed 2023·Granted Jun 18, 2024·0 cites·20 claims
- 1787US11448745B2Sensor device and system, and biometric sensing method and systemASAHI KASEI MICRODEVICES CORP·Filed 2019·Granted Sep 20, 2022·9 cites·13 claims
- 1887US10656463B2Display deviceSHARP KK·Filed 2019·Granted May 19, 2020·2 cites·5 claims
- 1987US10530976B2Endoscope probes and systems, and methods for use therewithCANON USA INC·Filed 2018·Granted Jan 7, 2020·4 cites·15 claims
- 2085US7675629B2Exposure apparatus and device manufacturing method using a common path interferometer to form an interference pattern and a processor to calculate optical characteristics of projection optics using the interference patternCANON KK·Filed 2007·Granted Mar 9, 2010·14 cites·17 claims
- 2184US7573563B2Exposure apparatus and device manufacturing methodCANON KK·Filed 2006·Granted Aug 11, 2009·7 cites·5 claims
- 2284US4073725AMethod and apparatus for liquid chromatography under elevated pressureHITACHI LTD·Filed 1976·Granted Feb 14, 1978·42 cites·15 claims
- 2382US11770105B2Methods and apparatus for driver calibrationSEMICONDUCTOR COMPONENTS IND LLC·Filed 2020·Granted Sep 26, 2023·1 cites·20 claims
- 2480US5461474AInspection apparatus for detecting foreign matter on a surface to be inspected, and an exposure apparatus and a device manufacturing method using the sameCANON KK·Filed 1994·Granted Oct 24, 1995·49 cites·26 claims
- 2579US4133753AMethod of ion exchange chromatographyHITACHI LTD·Filed 1977·Granted Jan 9, 1979·28 cites·12 claims
- 2678US7095497B2Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatusCANON KK·Filed 2002·Granted Aug 22, 2006·16 cites·3 claims
- 2777US7180051B2Polarization state detecting system, light source, and exposure apparatusCANON KK·Filed 2005·Granted Feb 20, 2007·4 cites·5 claims
- 2876US10682044B2Spectrally encoded forward view and spectrally encoded multi-view endoscope using back-reflected light between reflective surfacesCANON USA INC·Filed 2018·Granted Jun 16, 2020·2 cites·26 claims
- 2976US7466395B2Exposure apparatus and device manufacturing method using the apparatusCANON KK·Filed 2006·Granted Dec 16, 2008·4 cites·10 claims
- 3076US5652657AInspection system for original with pellicleCANON KK·Filed 1995·Granted Jul 29, 1997·44 cites·6 claims
- 3175US12171410B2Endoscope observation window cleaningCANON USA INC·Filed 2020·Granted Dec 24, 2024·1 cites·15 claims
- 3275US5777744AExposure state detecting system and exposure apparatus using the sameCANON KK·Filed 1996·Granted Jul 7, 1998·46 cites·24 claims
- 3373US7015456B2Exposure apparatus that acquires information regarding a polarization state of light from a light sourceCANON KK·Filed 2003·Granted Mar 21, 2006·11 cites·7 claims
- 3473US6594012B2Exposure apparatusCANON KK·Filed 1997·Granted Jul 15, 2003·32 cites·49 claims
- 3573US5861952AOptical inspection method and apparatus including intensity modulation of a light beam and detection of light scattered at an inspection positionCANON KK·Filed 1992·Granted Jan 19, 1999·37 cites·8 claims
- 3672US7083876B2Lead-acid batterySHIN KOBE ELECTRIC MACHINERY·Filed 2002·Granted Aug 1, 2006·25 cites·5 claims
- 3771US11406327B2Imaging catheter assemblyCANON USA INC·Filed 2018·Granted Aug 9, 2022·1 cites·21 claims
- 3871US7251029B2Birefringence measurement apparatus, strain remover, polarimeter and exposure apparatusCANON KK·Filed 2003·Granted Jul 31, 2007·12 cites·23 claims
- 3971US5585918AForeign particle inspecting systemCANON KK·Filed 1995·Granted Dec 17, 1996·39 cites·10 claims
- 4070US11213191B2Optical fiber arrangement for endoscopeCANON USA INC·Filed 2019·Granted Jan 4, 2022·1 cites·19 claims
- 4170US10234694B2Spectrally encoded probesCANON USA INC·Filed 2017·Granted Mar 19, 2019·1 cites·26 claims
- 4270US5750294ABest focus determining methodCANON KK·Filed 1996·Granted May 12, 1998·30 cites·8 claims
- 4369US10444146B2Optical probe, light intensity detection, imaging method and systemCANON USA INC·Filed 2016·Granted Oct 15, 2019·1 cites·19 claims
- 4469US10194065B2Endoscope probes and systems, and methods for use therewithCANON USA INC·Filed 2016·Granted Jan 29, 2019·1 cites·24 claims
- 4569US4441627ABag system for transportation of bulk liquidsFELL DON LTD·Filed 1981·Granted Apr 10, 1984·35 cites·7 claims
- 4668US7286226B2Method and apparatus for measuring birefringenceCANON KK·Filed 2003·Granted Oct 23, 2007·8 cites·7 claims
- 4767US5321502AMeasuring method and measuring apparatusCANON KK·Filed 1992·Granted Jun 14, 1994·25 cites·9 claims
- 4867US4140695AProcess for producing copper phthalocyaninesIHARA CHEMICAL IND CO·Filed 1977·Granted Feb 20, 1979·6 cites·6 claims
- 4966US6295118B1Optical arrangement for exposure apparatusCANON KK·Filed 1997·Granted Sep 25, 2001·23 cites·27 claims
- 5066US4221296AShipping assemblyFELL DON LTD·Filed 1979·Granted Sep 9, 1980·28 cites·5 claims
Showing the top 50 of 96 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →