Inventor · disambiguated record
Sergey Velichko
Also filed as: VELICHKO SERGEY · VELICHKO SERGEY A
37 granted patents·9 pending applications·398 citations·filing 1996–2022
98Inventor score
Files withSEMICONDUCTOR COMPONENTS IND LLC24MICRON TECHNOLOGY INC10SEMICONDUCTOR COMPONENTS IND5VELICHKO SERGEY A2APTINA IMAGING CORP1
Top patents by PatentIndex Score
46 records- 0198US9373732B2Image sensors with reflective optical cavity pixelsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Jun 21, 2016·55 cites·18 claims
- 0295US10110840B2Image sensor pixels with overflow capabilitiesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Oct 23, 2018·14 cites·19 claims
- 0394US9182490B2Video and 3D time-of-flight image sensorsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Nov 10, 2015·32 cites·17 claims
- 0493US10014333B2Back-side illuminated pixels with interconnect layersSEMICONDUCTOR COMPONENTS IND LLC·Filed 2015·Granted Jul 3, 2018·12 cites·19 claims
- 0592US11218653B2Methods and circuitry for improving global shutter efficiency in backside illuminated high dynamic range image sensor pixelsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2019·Granted Jan 4, 2022·10 cites·18 claims
- 0692US10313613B2High dynamic range image sensors with flicker and fixed pattern noise mitigationSEMICONDUCTOR COMPONENTS IND LLC·Filed 2017·Granted Jun 4, 2019·9 cites·20 claims
- 0791US9942503B2Image sensors having high-efficiency charge storage capabilitiesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Apr 10, 2018·8 cites·19 claims
- 0891US9854184B2Imaging pixels with a fully depleted charge transfer pathSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Dec 26, 2017·7 cites·20 claims
- 0990US9748298B2Image sensors with backside trench structuresSEMICONDUCTOR COMPONENTS IND LLC·Filed 2015·Granted Aug 29, 2017·7 cites·18 claims
- 1090US9749553B2Imaging systems with stacked image sensorsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2014·Granted Aug 29, 2017·11 cites·6 claims
- 1190US9344647B2Imaging systems with dynamic shutter operationSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted May 17, 2016·10 cites·18 claims
- 1289US10567689B2Image sensors having multi-storage image sensor pixelsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2018·Granted Feb 18, 2020·6 cites·21 claims
- 1389US9105546B2Imaging systems with backside illuminated near infrared imaging pixelsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Aug 11, 2015·5 cites·14 claims
- 1489US7383147B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2006·Granted Jun 3, 2008·15 cites·20 claims
- 1588US10630928B2Image sensor pixels with overflow capabilitiesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2018·Granted Apr 21, 2020·4 cites·18 claims
- 1688US7165004B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 16, 2007·14 cites·19 claims
- 1787US12407954B2Image sensors having high dynamic range pixelsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2022·Granted Sep 2, 2025·1 cites·22 claims
- 1887US9761624B2Pixels for high performance image sensorSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Sep 12, 2017·5 cites·17 claims
- 1986US10163963B2Image sensors with vertically stacked photodiodes and vertical transfer gatesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2017·Granted Dec 25, 2018·3 cites·17 claims
- 2086US10075704B2Methods and apparatus for generating test and overlay patterns in image sensorsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2015·Granted Sep 11, 2018·6 cites·16 claims
- 2186US8878264B2Global shutter pixel with improved efficiencyVELICHKO SERGEY·Filed 2011·Granted Nov 4, 2014·12 cites·11 claims
- 2285US10325947B2Global shutter image sensors with light guide and light shield structuresSEMICONDUCTOR COMPONENTS IND LLC·Filed 2014·Granted Jun 18, 2019·6 cites·12 claims
- 2385US5847276AFluid displacement level, density and concentration measurement systemSCP GLOBAL TECHNOLOGIES·Filed 1997·Granted Dec 8, 1998·69 cites·9 claims
- 2484US7010451B2Dynamic creation and modification of wafer test maps during wafer testingMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 7, 2006·26 cites·35 claims
- 2581US9628732B2Imaging systems and methods for performing column-based image sensor pixel gain adjustmentsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2014·Granted Apr 18, 2017·4 cites·18 claims
- 2678US10009552B2Imaging systems with front side illuminated near infrared imaging pixelsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2013·Granted Jun 26, 2018·1 cites·20 claims
- 2775US10615217B2Image sensors with vertically stacked photodiodes and vertical transfer gatesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2018·Granted Apr 7, 2020·1 cites·20 claims
- 2870US7139672B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 21, 2006·10 cites·23 claims
- 2969US7833819B2Method and apparatus for decreasing storage node parasitic charge in active pixel image sensorsAPTINA IMAGING CORP·Filed 2008·Granted Nov 16, 2010·2 cites·5 claims
- 3069US7162386B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 9, 2007·10 cites·71 claims
- 3167US9232159B2Imaging systems with crosstalk calibration pixelsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Jan 5, 2016·1 cites·16 claims
- 3266US7337088B2Intelligent measurement modular semiconductor parametric test systemMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 26, 2008·9 cites·15 claims
- 3362US11778343B2Methods and circuitry for improving global shutter efficiency in backside illuminated high dynamic range image sensor pixelsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2021·Granted Oct 3, 2023·0 cites·19 claims
- 3461US11114493B2Image sensors with vertically stacked photodiodes and vertical transfer gatesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2020·Granted Sep 7, 2021·0 cites·18 claims
- 3556US10609312B2Imaging pixels with a fully depleted charge transfer pathSEMICONDUCTOR COMPONENTS IND LLC·Filed 2017·Granted Mar 31, 2020·0 cites·20 claims
- 3651US2009321799A1Method and apparatus for increasing conversion gain in imagersVELICHKO SERGEY A·Filed 2008·Application pending·0 cites
- 3748US2006212253A1Intelligent measurement modular semiconductor parametric test systemMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 3844US7619184B2Multi-parameter process and control methodMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 17, 2009·2 cites·41 claims
- 3943US5744716AFluid displacement level, density and concentration measurement systemSCP GLOBAL TECHNOLOGIES A DIVI·Filed 1996·Granted Apr 28, 1998·11 cites·21 claims
- 4042US2006064268A1Dynamic creation and modification of wafer test maps during wafer testingMICRON TECHNOLOGY INC·Filed 2005·Application pending·0 cites
- 4142US2007112538A1Concurrent control of semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2007·Application pending·0 cites
- 4241US2022210353A1High dynamic range image sensorsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2020·Application pending·0 cites
- 4340US2018294304A1Image sensors with vertically stacked photodiodes and vertical transfer gatesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2017·Application pending·0 cites
- 4439US2021289154A1High dynamic range imaging pixels with charge overflowSEMICONDUCTOR COMPONENTS IND LLC·Filed 2020·Application pending·0 cites
- 4539US2006027566A1Multi-parameter process and control methodVELICHKO SERGEY A·Filed 2005·Application pending·0 cites
- 4635US2002152046A1Concurrent control of semiconductor parametric testingFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →