Inventor · disambiguated record
Seok Min Yun
Also filed as: YUN SEOK · YUN SEOK MIN
8 granted patents·1 pending application·77 citations·filing 2004–2019
82Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4GLOBALWAFERS CO LTD2KOREA INST SCI & TECH1MEMC ELECTRONIC MATERIALS1SUNEDISON SEMICONDUCTOR LTD1
Top patents by PatentIndex Score
9 records- 0193US7189560B2Methods and apparatuses of separating cells using magnets and droplet type cell suspensionKOREA INST SCI & TECH·Filed 2004·Granted Mar 13, 2007·68 cites·13 claims
- 0287US11085126B2Systems for selectively feeding chunk polysilicon or granular polysilicon in a crystal growth chamberGLOBALWAFERS CO LTD·Filed 2019·Granted Aug 10, 2021·1 cites·8 claims
- 0384US10577717B2Systems for selectively feeding chunk polysilicon or granular polysilicon in a crystal growth chamberGLOBALWAFERS CO LTD·Filed 2019·Granted Mar 3, 2020·4 cites·7 claims
- 0467US10273596B2Systems for selectively feeding chunk polysilicon or granular polysilicon in a crystal growth chamberSUNEDISON SEMICONDUCTOR LTD·Filed 2016·Granted Apr 30, 2019·1 cites·20 claims
- 0559US7522492B2Circuit and method for detecting address in pre-groove (ADIP) signal in wobble detection system of optical disc apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 21, 2009·0 cites·10 claims
- 0657US7952973B2Method of controlling recording of optical disc device and optical disc device using the methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted May 31, 2011·0 cites·16 claims
- 0756US8833564B1Systems and methods for reducing dust in granular materialMEMC ELECTRONIC MATERIALS·Filed 2013·Granted Sep 16, 2014·3 cites·9 claims
- 0850US2008297819A1Servo control apparatus in optical disc device and method of controlling servoSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0945US7272087B2Circuit and method for detecting address in pre-groove (ADIP) signal in wobble detection system of optical disc apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 18, 2007·0 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →