Inventor · disambiguated record
Shigekazu Aoki
Also filed as: AOKI SHIGEKAZU
10 granted patents·4 pending applications·72 citations·filing 1998–2024
87Inventor score
Top patents by PatentIndex Score
14 records- 0188US12321090B2Light source apparatus and projectorSEIKO EPSON CORP·Filed 2023·Granted Jun 3, 2025·1 cites·10 claims
- 0284US10877361B2Cooling device and projectorSEIKO EPSON CORP·Filed 2019·Granted Dec 29, 2020·3 cites·12 claims
- 0370US9933693B2Optical device, light source device, and projectorSEIKO EPSON CORP·Filed 2016·Granted Apr 3, 2018·1 cites·16 claims
- 0465US6335887B1Semiconductor memory device allowing switching of word configurationMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 1, 2002·14 cites·12 claims
- 0562US5943280ASemiconductor memory device which can be tested while selecting word lines successively at high speedMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 24, 1999·27 cites·15 claims
- 0660US2025189877A1Illuminator and projectorSEIKO EPSON CORP·Filed 2024·Application pending·0 cites
- 0759US7171592B2Self-testing circuit in semiconductor memory deviceFUJITSU LTD·Filed 2003·Granted Jan 30, 2007·13 cites·19 claims
- 0855US2024126156A1Light source device and projectorSEIKO EPSON CORP·Filed 2023·Application pending·0 cites
- 0954US2025036017A1Illuminator and projectorSEIKO EPSON CORP·Filed 2024·Application pending·0 cites
- 1051US11906888B2Light source apparatus and projectorSEIKO EPSON CORP·Filed 2021·Granted Feb 20, 2024·0 cites·12 claims
- 1151US6750744B2Electromagnetic relayOMRON TATEISI ELECTRONICS CO·Filed 2002·Granted Jun 15, 2004·8 cites·4 claims
- 1246US7256591B2Probe card, having cantilever-type probe and methodFUJITSU LTD·Filed 2002·Granted Aug 14, 2007·5 cites·17 claims
- 1344US10451958B2Wavelength conversion device, illumination device and projectorSEIKO EPSON CORP·Filed 2016·Granted Oct 22, 2019·0 cites·18 claims
- 1439US2005158005A1Optical fiber holding member and method of manufacturing the sameOMRON TATEISI ELECTRONICS CO·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →