Inventor · disambiguated record
Shinobu Asayama
Also filed as: ASAYAMA SHINOBU
16 granted patents·1 pending application·42 citations·filing 2005–2024
90Inventor score
Files withNEC ELECTRONICS CORP6RENESAS ELECTRONICS CORP5ASAYAMA SHINOBU4SONY SEMICONDUCTOR SOLUTIONS CORP2
Top patents by PatentIndex Score
17 records- 0185US7889540B2Semiconductor device including memory having nodes connected with continuous diffusion layer but isolated from each other by transistorRENESAS ELECTRONICS CORP·Filed 2008·Granted Feb 15, 2011·12 cites·3 claims
- 0279US8908420B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2013·Granted Dec 9, 2014·4 cites·12 claims
- 0373US8391093B2Semiconductor memory device including SRAM cellASAYAMA SHINOBU·Filed 2011·Granted Mar 5, 2013·4 cites·16 claims
- 0473US2025031477A1Image sensorSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2024·Application pending·0 cites
- 0567US8004878B2Semiconductor device and method for designing the sameRENESAS ELECTRONICS CORP·Filed 2009·Granted Aug 23, 2011·6 cites·10 claims
- 0666US7239538B2Semiconductor storage deviceNEC ELECTRONICS CORP·Filed 2005·Granted Jul 3, 2007·6 cites·6 claims
- 0760US8737118B2Semiconductor memory device and test method thereforASAYAMA SHINOBU·Filed 2012·Granted May 27, 2014·2 cites·10 claims
- 0859US8218352B2Semiconductor device including memory having nodes connected with continuous diffusion layer but isolated from each other by transistorASAYAMA SHINOBU·Filed 2010·Granted Jul 10, 2012·1 cites·6 claims
- 0956US12142626B2Image sensorSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2020·Granted Nov 12, 2024·0 cites·23 claims
- 1055US7274589B2Semiconductor storage deviceNEC ELECTRONICS CORP·Filed 2005·Granted Sep 25, 2007·3 cites·4 claims
- 1154US9053816B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2014·Granted Jun 9, 2015·0 cites·2 claims
- 1252US9190414B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Nov 17, 2015·0 cites·11 claims
- 1349US7825471B2Semiconductor memory device including SRAM cell having well power potential supply region provided thereinNEC ELECTRONICS CORP·Filed 2008·Granted Nov 2, 2010·2 cites·3 claims
- 1446US7821815B2Memory cell and semiconductor memory device having thereof memory cellNEC ELECTRONICS CORP·Filed 2008·Granted Oct 26, 2010·1 cites·20 claims
- 1545US7821817B2Semiconductor storage deviceNEC ELECTRONICS CORP·Filed 2008·Granted Oct 26, 2010·1 cites·14 claims
- 1639US8284591B2Semiconductor memory device and test method thereforASAYAMA SHINOBU·Filed 2010·Granted Oct 9, 2012·0 cites·13 claims
- 1738US7782658B2Semiconductor deviceNEC ELECTRONICS CORP·Filed 2008·Granted Aug 24, 2010·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →